Gary L. Orlove

Individual Member | Thermal Imaging Consultant at Thermal Imaging Consultant
Orlove, Gary L.
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SPIE Membership: 1.8 years total | 1.8 years voting
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Area of Expertise: Infrared Thermography, Non Contact Temperature Measurement, Instructor led and online course development, Performance testing of thermal imaging systems
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Profile Summary

Mr. Orlove has using infrared thermography since 1975. During that time he has accumulated experience in field diagnostics as a consultant to industry, and has been employed by three major manufacturers of infrared equipment. His duties have included selling, marketing, testing, and designing infrared cameras. Gary has also published several papers on the technology and its applications.

Mr. Orlove starting teaching infrared thermography at the University of Wisconsin in 1978. In 2000 he co-founded the InfraMation Conference, which has grown to become the largest annual IR conference for thermographers. He is a past chairman of the ASNT Thermal / Infrared Technical Committee, and is a member of ASNT, ISO, and ASTM thermography standards committees. Mr. Orlove is the sole voting member for the United States representing ANSI on ISO thermography standards. He has also received an award from NASA for contributions to the Space Shuttle Thermal Imager Program.

His responsibilities have included managing an infrared training facility in the U.S., technical support for infrared users, marketing and sales, advanced infrared product conception and development, and European Sales Manager. He has worked for AGEMA Infrared Systems, Inframetrics, Inc, The Academy of Infrared Thermography, and FLIR Systems. His roles at the Infrared Training Center included course development and instruction, web site management, development of computer based courseware, advanced technical support, co-chairman of the annual InfraMation thermographer’s conference, and publisher and editor of ITC’s highly acclaimed monthly newsletter.

Mr. Orlove holds a B.S. in zoology and a B.S.M.E. in energy engineering, both from the University of Wisconsin and is a registered Professional Engineer. He also holds certifications from the American Society for Nondestructive Testing as an NDT Level III and a Category 3 in Thermal Infrared Testing from The British Institute of Non Destructive Testing.

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