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Conference 12001 > Paper 12001-43
Paper 12001-43

UV LED reliability: degradation mechanisms and challenges

26 January 2022 • 2:30 PM - 3:00 PM PST | Room 152 (Upper Mezzanine South)

Abstract

The market for UV LEDs is experiencing a rapid growth, also driven by the need for effective and efficient disinfection systems. Before UV LEDs can be widely accepted by the market, they need to demonstrate a high reliability, with lifetimes of several thousands of hours. Several physical processes may limit the reliability of UVB and UVC LEDs, resulting in a loss in efficiency during long term operation.

This paper aims at discussing the most relevant processes that can lead to the degradation of UVB and UVC LEDs, with focus on: (i) instability of the electrical properties, which may result in gradual changes in the turn-on voltage of the devices during long-term operation. (ii) The generation of defects within the active region of the devices, with consequent increase in the Shockley-Read-Hall non-radiative recombination rate. Optical spectroscopy is found to be very effective for the identification of deep (midgap) traps during operation of the devices. (iii) trap states near the junction, with consequent impact on trap-assisted-tunneling of the current-voltage characteristics. (iv) the propagation of point defects, especially impurities, and accumulation of charges at heterointerfaces, that can reduce the carrier injection efficiency, thus leading to a decrease in the emitted optical power.

Presenter

Univ. di Padova (Italy)
Matteo Meneghini received his PhD in Electronic and Telecommunication Engineering (University of Padova), working on the optimization of GaN-based LED and laser structures. He is now associate professor at the Department of Information Engineering at the University of Padova. His main interest is the characterization, reliability and modeling of compound semiconductor devices (LEDs, laser diodes, HEMTs), and optoelectronic components, including solar cells. Within these activities, he has published more than 400 journal and conference proceedings papers.
Presenter/Author
Univ. di Padova (Italy)
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Univ. di Padova (Italy)
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Univ. di Padova (Italy)
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Univ. di Padova (Italy)
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Univ. di Padova (Italy)
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Nicola Roccato
Univ. di Padova (Italy)
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Univ. di Padova (Italy)
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Massimo Grigoletto
Univ. di Padova (Italy)
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Univ. di Padova (Italy)
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Ferdinand-Braun-Institut (Germany)
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Johannes Glaab
Ferdinand-Braun-Institut (Germany)
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Ferdinand-Braun-Institut (Germany)
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Technische Univ. Berlin (Germany)
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Technische Univ. Berlin (Germany)
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Ferdinand-Braun-Institut (Germany), Technische Univ. Berlin (Germany)
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Univ. di Padova (Italy)
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Univ. di Padova (Italy)