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Conference 12002 > Paper 12002-54
Paper 12002-54

Copper-based delafossite Cu(M)O2 with M={Fe, Cr} materials revisited: from thermodynamic calculation to p-type TCO thin films optimization through easy and low-cost laser annealing

Room 151 (Upper Mezzanine South)

Abstract

The Cu-Fe-O and Cu-Cr-O system has a great technological interest in the copper industry, photocatalysis and transparent devices. In these systems, Delafossite phases CuMO2 exhibit remarkable electrical, thermoelectric, optical and optoelectrical properties. Therefore, an in-depth understanding of the stability of this phase becomes of particular interest for fundamental and applied researches. Thermostructural analysis were first used to provide a better understanding of the stability of CuMO2 with M = {Fe, Cr} with a substantial degree of cationic non-stoichiometry. Thanks to this guide, the deposition of thin films by rf sputtering was carried out at temperature compatible with the use of cheap transparent substrates. Conventional thermal treatment as well as rapid post laser annealing using a photolithography machine were used to optimize the p-type TCO properties, opening up exciting prospects for fast and low cost making the most of these materials.

Presenter

Univ. de Toulouse (France), Univ. Paul Sabatier (France)
Antoine Barnabé received the Ph.D. degree in chemistry of materials from the University de Caen Basse Normandie, France, in 1999. He held a post-doctoral position at Northwestern University, Evanston, IL, USA, in 2000. He is currently Professor at the CIRIMAT Laboratory, Toulouse Paul Sabatier University, France and Director of the Electron Microscopy characterization center CASTAING in Toulouse. His current research interests are mainly focused on functional metal oxide powders, ceramics and thin films with outstanding electronic and opto-electronic properties (TCO, gas sensors and thermoelectrics for the latest ones…). He’s involved in structural study of these oxides powders, ceramics and thin films prepared by PVD technique by X-ray diffraction (Rietveld refinement and microstructural analysis) and transmission electron microscopy (electron diffraction and high resolution image) as well as multi-scale microstructural and chemical analysis of a whole range of materials.
Presenter/Author
Univ. de Toulouse (France), Univ. Paul Sabatier (France)