• Explore Membership
  • Student Services
  • Student Events
    Student Chapters
    MKS Instruments Awards
    Student Author Travel Grants
    Visiting Lecturers
    Lecturer Directory
    Travel Policies
  • Early Career Resources
  • Corporate Membership
  • SPIE Professional Magazine
Print PageEmail Page

Kevin Harding

Mr. Kevin  Harding

Principle Engineer/Optical Technology Leader
GE Global Research

KW-C293 Applied Optics Lab
1 Research Cir

Niskayuna NY 12309-1027
United States

tel: 518 387 5827
fax: 518 387 7080
E-mail: harding@ge.com

Area of Expertise

Optical metrology


A 30-year optics industry veteran, Kevin G. Harding is principal engineer and project leader for the General Electric Global Research Center in New York where he leads the activity in Optical Metrology.

An SPIE Fellow, Harding has served as conference chair or co-chair on 15 SPIE conferences and taught over 60 short courses industry wide on machine vision optics, 3D imaging, laser sensors, and opto-mechanical technology. He has contributed over 100 papers, including 3 trade journal articles and 6 book chapters in the area of optical inspection and measurement technology, and has received 35 patents.

Harding's BA degree in physics/philosophy is from Rider College, Lawrenceville, N.J., and his MS in optics is from the University of Rochester. Before joining GE, he was director of the Electro-Optics Lab at the Industrial Technology Institute for 14 years where he built the electro-optics business.

Lecture Title(s)

The Promise and Payoff of Machine Vision
In the past 25 plus years, machine vision has grown from a high priced solution looking for a problem to solve, to a multi-billion dollar industry playing a crucial role in today's high demand production environment. Today, a full featured vision processor will fit into a standard PC box, often as a plug in card, and the fast, dedicated purpose systems will fit in the palm of your hand, connecting to any PC over an internet connection. The 3D vision system has likewise made great strides, though it remains just a step or two behind its 2D cousin. Today, high quality 3D data can be obtained from rugged, even portable units with simple to use interfaces, producing inspection information based upon part tolerances and CAD models in a matter of seconds. But what machine vision is today, and what it is becoming, is a technological tool on its way to becoming as common place as the computer, not only in production environments, but potentially in our every day lives.

Calibration Methods for 3D Measurement Systems
With the improving capabilities and acceptance of laser triangulation based systems, the natural extension of these systems to 3D measurement tools is gradually coming about. As with any metrology tool, calibration, including the ability to verify calibration in the field is becoming an important issue to potential users. Optical probes do not work the same as mechanical touch probes, and as such have a whole new set of problems as well as capabilities. The ability to establish a calibration over an entire field at one time, using tens to hundreds of thousands of points rather than tens to a hundred points is both viable and necessary to effective 3D system calibration.

3D Machine Vision as a Shop Floor Metrology Tool
Three dimensional vision based measurement systems have made some in-roads into production metrology applications, notably in the electronics field. However, in the more traditional fields of durable goods now dominated by hard gages and CMMs, 3D optical systems has been hampered by perceptions and real limitations. This presentation will review where 3D vision is today, and what advances have been made to enable more quantitative, shop floor metrology applications.

The Art of Invention: Optics and the Recording of Knowledge
People have been coming up with new ideas throughout history, some simple, some that have changed the world. This presentation will trace the history of the recording of information, and show how optical technology has, and continues to play and important role in the recording and communication of knowledge. This is intended as an interactive presentation fun for inventors of all ages.

Ready for the benefits of individual SPIE membership?
Join or Renew
Already a member? Get access to member-only content.
Sign In

Member-only Content:

These articles are available only to SPIE Members as a valuable resource.
Member-only content Icon
Icon denotes member-only content.

The Joe and Agnete Yaver Memorial Scholarship

SPIE Online Courses

At Your Pace - On Your Schedule

SPIE t-shirts, ties, and scarves are now available. Get free shipping for a limited time. Shop now.

2018 Salary Report