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Tatiana Novikova

Dr. Tatiana  Novikova

Group Director - Applied Optics and Polarimetry
Lab de Physique des Interfaces et des Couches Minces
Ecole Polytechnique
Applied Optics and Polarimetry Group
route de Saclay

Palaiseau CEDEX  91128

E-mail: tatiana.novikova@polytechnique.edu
Web: https://www.polytechnique.edu/fr/le-laboratoire-de-physique-des-interfaces-et-couches-minces-lpicm

Area of Expertise

Optics of polarized light: fundamentals of Mueller polarimetry, modeling of interaction of polarized light with structured and random media, innovative polarimetric instrumentation, cutting-edge metrological and biomedical applications of polarized light.


Dr. Tatiana Novikova leads the Group of Applied Optics and Polarimetry at the Laboratory of Physics of Interfaces and Thin Films of CNRS, Ecole polytechnique, Institut Polytechnique de Paris, France. She obtained MSc degree in applied mathematics from the Moscow State University (Russia), PhD in applied mathematics and physics from the Moscow Institute of Mathematical Modelling (Russia), and Habilitation in Physics from the University Paris-Sud (France). Dr Novikova has served as a Guest Editor of the Journal of Biomedical Optics in 2016. She is a Senior member of OSA. Dr Novikova got the OSA Outstanding Reviewer recognition Award in 2018 and was featured in SPIE "Women in Optics" Planner 2018. Dr Novikova is a Program Committee member of several national and international conferences on optics. Her research interests and area of expertise include polarimetry, biomedical imaging and computational modeling of electromagnetic wave interaction with structured and random media.

Lecture Title(s)

Optical Imaging Mueller Polarimetry for Biomedical Applications

This talk is dedicated to biomedical applications of polarized light for early cancer diagnosis. Ex vivo studies of multi-spectral Mueller images of human colon have revealed the enhanced contrast between healthy and cancerous zones of tissue compared to non-polarized intensity images. The results of polarimetric measurements and numerical Monte Carlo modeling confirmed the scattering of visible polarized light within the biological tissue by scatterers which size is much smaller than the wavelength of probing light (so called Rayleigh regime). Both ex-vivo and in-vivo studies of uterine cervix tissue demonstrate strong depolarization and significant birefringence in healthy zones, whereas the values of birefringence drop drastically within the zones of cervical intraepithelial neoplasia (CIN I-III). The statistical analysis of clinical polarimetric data showed both sensitivity and specificity of 88% in detecting cervical precancerous lesions with Mueller polarimetry when using histopathology analysis as "gold standard" diagnosis. Our experimental and theoretical findings suggest the feasibility of non-invasive optical biopsy and ex vivo optical cancer staging with Mueller imaging polarimetry.

Metrological Applications of Mueller Polarimetry in Microelectronics

The studies of polarized light interaction with a matter provide valuable information about the sample that can be used in a broad range of applications. The basic advantages of polarimetric techniques consist in being cost-effective, fast and non-destructive, thus allowing the measurements even for in-situ applications. In this talk I will present both theoretical and experimental results on applications of polarized light for the characterization of layered and patterned media. Having access to complete set of polarimetric data, namely, spectrally or angularly resolved Mueller matrices of the samples, proved to be a key issue for the characterization of such samples. The complete Mueller polarimeters (operating in either spectroscopic or imaging mode) were developed in LPICM, targeting new applications such as semiconductor and nanoimprint test-structure metrology. We have shown that using spectral Mueller polarimetry data one can reconstruct the critical dimensions of microelectronic metrological structures: (i) with better precision compared to classical ellipsometry; (ii) faster than with conventional characterization techniques, such as AFM and SEM; (iii) in a non-destructive way contrary to SEM technique. Mueller images of back focal plane of high NA objective were shown to be also very sensitive to overlay defects (break of structure symmetry) in microelectronics fabrication process.

Thinking Broadly and Looking for New Career Paths

During my career in academia I have changed several countries and moved through several physics domains - from hot and cold plasma modeling to polarized light optics, starting from metrology and energy harvesting applications to the biomedical imaging. Moving from field to field one not only needs the distinctive technical competencies but also the soft skills, e.g. an ability to interact with the specialists in different scientific fields using their language. In this interactive workshop I will share my experience on importance of being ready to step out of your comfort zone, challenging yourself and doing new things while broadening your hard skills and developing your soft skills.

2019 Salary Report

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