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SPIE Professional April 2012

75 New SPIE Fellows for 2012

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SPIE is honoring 75 new Fellows of the Society this year, including its first members elected from New Zealand and the Czech Republic and two American experts in optics who join their fathers in attaining the rank of SPIE Fellow, the first time SPIE has had any father-son pairs attain the distinction.

The new Fellows were nominated by their peers for their technical achievements in biophotonics, laser and remote sensing technologies, image processing and acquisition, lithography, spectroscopy, and related fields. They are also honored for their service to the general optics community and to SPIE in particular.

Rick Millane, a professor at University of Canterbury in New Zealand, is the first SPIE member from that southern hemisphere nation to become an SPIE Fellow.

Similarly, Jiri Homola, of the Institute of Photonics and Electronics ASCR, and Helena Jelinková, professor at the Czech Technical University in Prague, are the first SPIE members from the Czech Republic elected to the rank of SPIE Fellow.

They join SPIE Fellows from Europe, Japan, Africa, Canada, Israel, India, China, the United States, Australia, Singapore, and elsewhere around the world. More than 900 SPIE members have become Fellows since the Society’s inception in 1955.

Father-Son Fellows

Among the newly chosen SPIE Fellows are David Wick of Sandia National Labs, who joins his father Raymond Wick of the Institute of Defense Analyses as an SPIE Fellow, and Alexei Glebov, president and CEO of OptiGrate Corp., whose father Leonid Glebov of the University of Central Florida (UCF) is also an SPIE Fellow.

Leonid Glebov founded OptiGrate in 1999 with the help of the UCF Business Incubation Program while Alexei Glebov was working in Silicon Valley. OptiGrate has grown from 12 employees to 30 over the nearly four years since Alexei has been company president.


  Leonid Glebov, left, with son Alexei Glebov.

Attending SPIE conferences is a family affair for the Glebovs. “There were times when I would meet him at conferences more than at other times,” Alexei says of his father. Another of Leonid’s sons, Boris, has also presented papers at SPIE Optics + Photonics.

David Wick, a former member of the SPIE Board of Directors, presented his father’s Fellow plaque to him at SPIE Optics + Photonics in 2008. This year the elder Wick plans to present David Wick’s plaque to his son at SPIE Optics + Photonics in August.

Raymond Wick says he and his wife didn’t push their son David in any particular career direction when he was young. However, “I think I did help David understand enough about how a laser works so that he then built a simple model and discussed the lasing process with his 6th-grade class at the Albuquerque Academy,” Raymond says.


  Raymond Wick, left, receives his SPIE Fellow plaque in 2008 from his son David.

David Wick says he was appreciative of his father’s help even though he didn’t receive an A on the project. “The funny thing was,” David says, “my 6th-grade science teacher didn’t believe that I was capable of understanding the concepts, so I got a B+.”


Call for SPIE Fellow Nominations

The SPIE Fellows Committee will accept nominations for the next class of SPIE Fellows through 15 September.

Nominees will be evaluated on their technical accomplishments in optics, photonics, and imaging, including publications and patents; service to the general optics community in the form of volunteer work at science fairs, service as an editor or technical reviewer, etc.; and service to SPIE.

Most SPIE Fellows have served as SPIE conference or symposium chairs, course instructors, journal editors, speakers, or committee members.

Nomination materials for candidates who are not elected the first time they are nominated are automatically considered in the next two years.

For more information, go to: spie.org/fellows

 


Have a question or comment about this article? Write to us at spieprofessional@spie.org.

 

To receive a print copy of SPIE Professional, the SPIE member magazine, become an SPIE member.


DOI: 10.1117/2.4201204.06

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