• Individual Members
  • Early Career Members
  • Student Members
  • Corporate Members
  • SPIE Professional Magazine
  • SPIE Professional Archives and Special Content
    Contact SPIE Professional
    Photonics for a Better World
    Open Access SPIE Professional
    Entrepreneurs SPIE Professional
  • Visiting Lecturers
  • Women In Optics
  • BACUS Technical Group
 
Print PageEmail Page
SPIE Professional October 2013

Talks on funding and cameras at SPIE Optifab

image for SPIE Optifab

SPIE President-Elect H. Philip Stahl will discuss NASA funding in one of two plenary sessions at SPIE Optifab, in Rochester, NY, 14-17 October.

Stahl, senior optical physicist at the Marshall Space Flight Center, will discuss NASA funding for optical fabrication and testing technology development on Tuesday, 15 October.

Stahl is the originator of the annual "Mirror Technology Days in the Government" workshops and a leading authority in optical metrology, optical engineering, and phase-measuring interferometry. Many of the world's largest telescopes have been fabricated with the aid of the high-speed and infrared phase-measuring Interferometers he developed, including the Keck, VLT and Gemini telescopes.

NASA has a variety of programs to fund enabling technologies for telescopes and astronomical instrumentation.

Steven Sasson, a retired Eastman Kodak project manager, will also give a plenary talk, discussing the development and commercialization of the first digital camera.

Kodak created the first digital camera prototype in 1975 and subsequently advanced the technology with megapixel imagers and image compression products in the mid 1980s. Sasson will discuss the commercialization of professional and consumer digital still cameras in the early 1990s and the internal Kodak reaction to these disruptive innovations.

logo for SPIE Optifab 2014SPIE Optifab will also include an exhibition at the Rochester Riverside Convention Center 15-17 October, and panel discussions on such topics as the future of metrology and export control reforms in the US.

Panelists at the optical metrology discussion will include

  • Scott DeFisher of OptiPro Systems (USA) who will discuss measurement and tolerances on freeform optics
  • Andrew Kulawiec of QED Technologies (USA), discussing extending interferometry for even tighter tolerances and more complex shapes
  • Erik Stover from AMETEK Precitech (USA), talking about contact and non-contact profilometry for aspheric optics
  • Marc Tricard of Zygo (USA) discussing metrology at the fringe
  • Steven VanKerkhove of Corning (USA) on developing metrology solutions to support aspheric fabrication

Twelve courses on optical fabrication and manufacturing, aspheric optics, metrology, optomechanics, thin films, and related topics will be offered during the week.

Conference chairs are SPIE Fellow Julie Bentley of University of Rochester and Matthias Pfaff of OptoTech Optikmaschinen (Germany)

More information: spie.org/optifab



DOI: 10.1117/2.4201310.26

Ready for the benefits of individual SPIE membership?
Join or Renew
Already a member? Get access to member-only content.
Sign In

SPIE Professional supports the NPI

NPI supporter badge


October 2013 Advertisers

        Applied Optics Research

 American Elements

DRS logo

LOGO FOR LaCroix Optical Co

Optimax logo

Photon Engineering logo

logo for Software Spectra

logo for South University of Science and Technology

Synopsys logo 

Build visibility in the optics and photonics community and reach a highly qualified audience by advertising in SPIE Professional


Like SPIE on Facebook

SPIE Facebook page

The SPIE Facebook page is a great place to find and share news on optics programs and photonics events.