New SPIE Fellows
SPIE has promoted 69 new Fellows of the Society for 2013.
SPIE has promoted 69 new Fellows of the Society this year to recognize the significant scientific and technical contributions of each in optics, photonics, and imaging as well as their service to SPIE.
This year’s honorees include the first SPIE members elected from Iceland (Jón Atli Benediktsson) and South Africa (Andrew Forbes).
“The SPIE Fellow award is given only for the highest technical achievement in optics and photonics, and friends and colleagues of the recipients should be aware of the special nature of this honor,” says SPIE President William Arnold.
“All of us congratulate these extraordinary people for their accomplishments.”
Twenty-nine new SPIE Fellows were honored at SPIE Photonics West in February and three recently promoted Fellows received their Fellow plaques at IS&T SPIE Electronic Imaging the same week.
New Fellows were also recognized at SPIE Medical Imaging, SPIE Advanced Lithography, and SPIE Smart Structures/NDE this year. New Fellows are recognized at a SPIE conference of their choosing during the year.
SPIE Fellow Cheng-Chung Lee of National Central University (Taiwan), chair of the 2012 SPIE Fellows Committee, also extended the committee’s congratulations and encouraged nominations of deserving candidates for next year’s awards.
Nominations for promotions in 2014 are due 15 September.
Nominees are evaluated on their technical accomplishments in optics, photonics, and imaging. Publications and patents are also considered as is service to SPIE and the general optics community in the form of volunteer work at science fairs or as an editor or technical reviewer.
Nominations of SPIE members working in industry are encouraged.
Nomination materials for candidates who are not elected the first time they are nominated are automatically considered in the next two years.
◊ Find more information about the new class of SPIE Fellows.
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