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SPIE Photonics West
4 - 6 Feb 2020
San Francisco, CA, United States

Mitutoyo America Corporation



BOOTH NUMBER: 3359

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Address
Mitutoyo America Corporation
965 Corporate Blvd
Aurora, IL
United States
60502-9176
Company Description
Mitutoyo America Corporation, the world's largest provider of measurement and inspection solutions, offers a complete selection of machines, sensors, systems and services with a line encompassing CMMs, vision, form, precision tools and instruments, and metrology data management software. Mitutoyo's nationwide network of metrology centers provides application, calibration, service, repair and educational programs for our 8,500+ metrology products.
Announcements
08 January 2020
TAGLENS
A breakthrough ultra-fast varifocal lens, will always be in focus, even with height differences, ensuring the highest observation efficiency ever. The focus range of TAGLENS is variable without changing the camera position
08 January 2020
FormTRACER AVANT:
FormTRACER AVANT is a revolutionary, hybrid contour and surface roughness measuring system with speed, efficiency and operability never seen previously. Featuring new technology, users can replace a detector on the FormTRACER AVANT without turning off the controller. A built-in drive tilt mechanism allows for the measurement of larger workpieces. Many optional accessories support a major reduction of total measurement time, from set up and measurement to evaluation.
08 January 2020
• MiSCAN Vision System:
MiSCAN is a multiple sensor microscopic-form measurement system using combined coordinate measuring machine (CMM) and vision measurement system technology and features a micro-form scanning probe. Allows highly accurate autonomous scanning covering micro-form to larger workpieces. The new MPP-NANO probe can use styli as small as 125 μm diameter to achieve measurement of microscopic workpieces. Using the observation camera, setup of measurement can be easily achieved. The SP25M scanning probe is also supported to allow small- and large-sized workpieces and features to be measured.
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