Automated Visual Inspection and Machine Vision VI

This conference addresses image acquisition and image exploitation topics to solve visual inspection and machine vision tasks automatically. Since elaborated approaches for acquiring images constitute the crucial base to successfully accomplish inspection tasks, particularly illumination, optics, sensors, and the complete acquisition setup composed of these ingredients, including the acquisition of image series, are within the focus of the conference. In this field, novel sensor systems like event-based vision sensors or multi- and hyperspectral sensors open new application opportunities. Moreover, to extract the inspection-relevant information from images, signal processing and exploitation methods that account for the physical formation of the images are of great interest. Here, classical methods, e.g., using a frequency representation of an image, together with machine learning methods are of interest. In this conference, new approaches, imaging systems, image processing methods, and applications

• automated visual inspection
• machine vision
• robust, high performance inspection
• visual quality monitoring and control
• image acquisition and exploitation.

• image data based on diverse optical properties of materials (reflectance, roughness, spectrum, complex refraction index, etc.)
• illumination techniques
• deflectometry
• mathematical models and methods
• image series, image fusion and active vision
• image processing and exploitation methods
• detection and classification
• physically-based image formation models
• pattern recognition
• light field methods
• event-based vision
• machine learning for automated visual inspection.

• automated inspection of industrially produced goods
• material recognition and verification
• detection of surface defects
• image-based measurement and control
• inspection of specular surfaces
• safety, security, and biometrics
• medicine and biology
• other application fields.