Plenary Event
Collocated: Optical Metrology Plenary Session
23 June 2021 • 16:30 - 17:30 BST 
Recording will be available soon
TTimes for this live event are all Central European Summer Time, CEST (UTC+2:00 hours)
Welcome Address and Plenary Speaker Introduction
Marc P. Georges, Liège Univ. (Belgium)
Jörg Seewig, Technische Univ. Kaiserslautern (Germany)
Symposium Chairs
Plenary Presentation
Optical Sociology: How Organizational Culture Impacts Advances in Optical Metrology
Peter de Groot, Zygo Corp. (United States)
Optical instruments have long played a role in manufacturing, and strong arguments favor accelerated adoption of fast, non-contact measurements of surfaces, shapes and positions as an enabler for industry 4.0. High-precision techniques such as optical interferometry have advanced considerably and have found applications ranging from semiconductor wafer lithography to automotive engine production.
Even though there are clear benefits, there are obstacles to the more widespread adoption of optical techniques for dimensional measurements. Many of these obstacles are technical--such as vibration sensitivity and metrological traceability; but others reflect the cultural gaps between academia, makers of optical instruments, standards organizations and end users. In this talk, I propose that understanding these cultural differences can assist in advancing optical methods for the most critical needs of data-driven manufacturing.
Peter de Groot, PhD is the Executive Director of R&D at Zygo Corporation, a world leader in the design and manufacture of optics and metrology systems. In addition to 140 patents for optical measuring instruments and techniques, Peter has published 180 technical papers, tutorials, and book chapters in physics, education, optics and metrology. He is an honorary professor at the University of Nottingham, a Fellow and Director of the SPIE, an SPIE Kingslake award winner, and an active contributor in the optics community.
This event occurred in the past.
Click here to view the recorded video in the SPIE Digital Library.Welcome Address and Plenary Speaker Introduction
Marc P. Georges, Liège Univ. (Belgium)
Jörg Seewig, Technische Univ. Kaiserslautern (Germany)
Symposium Chairs
Plenary Presentation
Optical Sociology: How Organizational Culture Impacts Advances in Optical Metrology
Peter de Groot, Zygo Corp. (United States)
Optical instruments have long played a role in manufacturing, and strong arguments favor accelerated adoption of fast, non-contact measurements of surfaces, shapes and positions as an enabler for industry 4.0. High-precision techniques such as optical interferometry have advanced considerably and have found applications ranging from semiconductor wafer lithography to automotive engine production.
Even though there are clear benefits, there are obstacles to the more widespread adoption of optical techniques for dimensional measurements. Many of these obstacles are technical--such as vibration sensitivity and metrological traceability; but others reflect the cultural gaps between academia, makers of optical instruments, standards organizations and end users. In this talk, I propose that understanding these cultural differences can assist in advancing optical methods for the most critical needs of data-driven manufacturing.
Peter de Groot, PhD is the Executive Director of R&D at Zygo Corporation, a world leader in the design and manufacture of optics and metrology systems. In addition to 140 patents for optical measuring instruments and techniques, Peter has published 180 technical papers, tutorials, and book chapters in physics, education, optics and metrology. He is an honorary professor at the University of Nottingham, a Fellow and Director of the SPIE, an SPIE Kingslake award winner, and an active contributor in the optics community.