Paper 13026-2
TeraFETs spectrometer
On demand | Presented live 22 April 2024
Abstract
For decades, TeraFETs have been used as THz and sub-THz detectors competing with commercial Schottky diode-based technology. More recently, short channel TeraFETs have been explored for THz vector detection measuring both the intensity and phase of the impinging THz or sub-THz radiation. We report on using TeraFETs as spectrometers, lineof- sight detectors, and frequency-to-digital converters. These applications use a single TeraFET excited at the gate-to-source and drain-to-source inputs, current-driven TeraFETs, or traveling wave multistage TeraFET amplifiers. Feeding the phase-shifted THz signals into the gate and source terminals of multistage TeraFET amplifiers greatly improves the response of the TeraFET spectrometer and enables the implementation of the frequency-to-digital converter using TeraFETs.
Presenter
Rensselaer Polytechnic Institute (United States)
Dr. Michael Shur is Patricia W. and C. Sheldon Roberts Professor of Solid State Electronics at Rensselaer Polytechnic Institute and co-founder of Sensor Electronics Technology, Inc., and Electronics of the Future, Inc. He is a Life Fellow of the US National Academy of Inventors, IEEE, APS, and ECS, and a Fellow of several other professional societies. His awards include IEEE and IET Awards, Tibbetts Award for Technology Commercialization, Senior Humboldt Research Award, Best Paper Awards, and St. Petersburg Technical University and the University of Vilnius Honorary Doctorates. He is an IEEE EDS and Sigma Xi Distinguished Lecturer and a Foreign Member of the Lithuanian Academy of Sciences.