Past event overview

Munich, Germany

SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.

SPIE Optical Metrology overview

Final programme (5 MB PDF)

Technical abstracts (2 MB PDF)

View 2017 event news + photos

View details for the collocated event, SPIE Digital Optical Technologies 2017

SPIE Optical Metrology is part of