Internationales Congress Center
Munich, Germany
21 - 25 June 2015

Past Event Overview

Munich, Germany

Thank you to all of those who participated at SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.

Review the 2015 Programme
 • Onsite news and photos
 • Final Technical Programme (2 MB PDF)
 • Technical Abstracts (1 MB PDF)
2015 Plenary Session
 Ramesh Raskar

Extreme Computational Imaging: Pohography, Health-tech and Displays 
Ramesh Raskar
MIT Media Lab,

2015 Conference Topics:
 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • O3A: Optics for Arts, Architecture, and Archaeology
 • Videometrics, Range Imaging, and Applications
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Automated Visual Inspection and Machine Vision

SPIE Optical Metrology is part of: