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    Past Event Overview

    Munich, Germany

    Thank you to all of those who participated at SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.

    Review the 2015 Programme
     • Onsite news and photos
     • Final Technical Programme (2 MB PDF)
     • Technical Abstracts (1 MB PDF)
    2015 Plenary Session
     Ramesh Raskar

    Extreme Computational Imaging: Pohography, Health-tech and Displays 
    Ramesh Raskar
    MIT Media Lab,

    2015 Conference Topics:
     • Optical Measurement Systems for Industrial Inspection
     • Modeling Aspects in Optical Metrology
     • O3A: Optics for Arts, Architecture, and Archaeology
     • Videometrics, Range Imaging, and Applications
     • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
     • Automated Visual Inspection and Machine Vision

    SPIE Optical Metrology is part of: