SPIE Optical Metrology in Munich

Join us in Munich
Present your research at SPIE Optical Metrology, the premier European conference where scientists, engineers, researchers, and product developers gather to discuss the latest research in measurement systems, modeling, multimodal sensing, and inspection.

Stay up to date on deadlines and announcements for this event.

Abstracts due
Conf. OM101, OM102, OM104, OM105, OM106 extended to 24 January 2021

Conference O3A (OM103) extended to 1 February 2021

Author notification
26 February 2021

Quick links

2021 Conference topics

•	Optical Measurement Systems for Industrial Inspection
•	Modeling Aspects in Optical Metrology
•	Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
•	Multimodal Sensing: Technologies and Applications
•	Automated Visual Inspection and Machine Vision
•	O3A: Optics for Arts, Architecture, and Archaeology

SPIE Optical Metrology is part of

Proceedings of SPIE

SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers.