SPIE Optical Metrology in Munich
Join us in Munich
Present your research at SPIE Optical Metrology, the premier European conference where scientists, engineers, researchers, and product developers gather to discuss the latest research in measurement systems, modeling, multimodal sensing, and inspection.
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Abstracts due
Conf. OM101, OM102, OM104, OM105, OM106 extended to 24 January 2021
Conference O3A (OM103) extended to 1 February 2021
Author notification
26 February 2021