SPIE Optical Metrology 2025

The conference offering the latest research in measurement systems, modeling, videometrics, and inspection

Share your research in Munich. The 2025 Call for Papers is now open.

SPIE Optical Metrology highlights the the latest advances in optical measurement systems. It is the meeting for emerging photonics fields within measurement systems, modeling, imaging, sensing, and inspection. Abstracts due 22 January 2025.

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2025 Symposium Chairs

Marc P. Georges

Univ. de Liège (Belgium)

Jörg Seewig

Technische Univ. Kaiserslautern (Germany)

SPIE Optical Metrology is part of the World of Photonics Congress

Learn more about the World of Photonics Congress

Your registration to SPIE Optical Metrology, grants you admission to all conferences held as part of the LASER World of Photonics Congress.