• Optical Metrology
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21 - 25 June 2021
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SPIE Optical Metrology will be online

SPIE Optical Metrology

Join the Optical Metrology conference online in June

SPIE Optical Metrology is the premier European conference for scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection. 

Registration information will be coming soon.

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Author notification
9 March 2021

Post-deadline submissions
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Manuscripts due 
21 May 2021

Quick links

Browse the 2021 conferences and paper submissions
Review the submission guidelines
Download the 2021 Call for papers

Conference topics

 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Multimodal Sensing: Technologies and Applications
 • Automated Visual Inspection and Machine Vision
 • O3A: Optics for Arts, Architecture, and Archaeology

SPIE Optical Metrology is part of

Proceedings of SPIE

SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 

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Browse Defense, Security, and Sensing 2011 papers