• Optical Metrology
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Internationales Congress Center
Munich, Germany
24 - 27 June 2019
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Mark your calendar for SPIE Optical Metrology 2019

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Attend the premier European conference for scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection. 

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Hear notable plenary speakers

World of Photonics Congress Opening Plenary Optical Metrology Plenary Session
Karsten Danzmann Richard Leach

"Listening to the universe with gravitational waves"

Karsten Danzmann
Director of Max Planck Institute for Gravitational Physics (Albert Einstein Institute) and Director of the Institute of Gravitation Physics at Leibniz Universität Hannover (Germany)

"Towards a complete framework for calibration of optical surface and coordinate measuring instruments"

Richard Leach
University of Nottingham, Chair Faculty of Engineering, Manufacturing Metrology Team (United Kingdom)

World of Photonics Congress Nobel Plenary Digital Optical Technologies Plenary Session
Gerard Mourou Christine Guillemot

"Passion for Extreme Light"

Gerard Mourou
Ecole Polytechnique (France)
2018 Physics Nobel Prize Laureate

"Light field image processing: overview and research problems"

Christine Guillemot
Director of Research, INRIA and Head of the Sirocco Research Team (France)

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2019 Conference topics

 • Optical Measurement Systems for Industrial Inspection
 • Modeling Aspects in Optical Metrology
 • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
 • Multimodal Sensing: Technologies and Applications NEW
 • Automated Visual Inspection and Machine Vision
 • O3A: Optics for Arts, Architecture, and Archaeology

SPIE Optical Metrology is part of

World of Photonics Congress

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Browse Defense, Security, and Sensing 2011 papers