• Optical Metrology
    Invitation
    Conferences
    Courses
    SPIE Event Policies
    For Authors/Presenters
Digital Forum
Online Only
21 - 25 June 2021
Search Program:
go
Print PageEmail PageView My Schedule

Invitation

Take this opportunity to share your research at SPIE Optical Metrology 2021. Come to meet with users and researchers to discuss the latest inventions and applications in the field of optical metrology. The symposium will highlight new optical principles and systems for metrology, multimodal sensing, and machine vision with applications in industrial design, production engineering, process monitoring, maintenance support, biotechnology, vehicle navigation, multimedia technology, architecture, archaeology, and arts. Special emphasis is directed to model-based, remote and active approaches, sensor fusion, robot guidance, image sequence processing and scene modelling, and biomaterials characterization, as well as to the preservation of our shared cultural heritage.

We invite engineers, scientists, researchers, trustees, and managers to attend this year's meeting.

Co-located with Laser 2021, this symposium will address the role of optics and lasers in the following areas:

  • Optical Measurement Systems for Industrial Inspection
  • Modeling Aspects in Optical Metrology
  • Optical Methods for Inspection, Characterization and Imaging of Biomaterials
  • Multimodal Sensing: Technologies and Applications
  • Automated Visual Inspection and Machine Vision
  • Optics for Arts, Architecture, and Archaeology

Take advantage of this unique opportunity to hear about the latest solutions to practical problems in industrial design and production engineering. Learn about recent advances in using optical technologies to preserve our shared cultural heritage. Find out about new approaches that push optical principles of measurement and testing at the macro, micro- and nanoscales to the forefront of metrology. Exchange new ideas, address your shared concerns, and get access to information not yet published in the mentioned topical areas. Share your research with other engineers, scientists, researchers, and managers. Presentations will be permanently archived in the SPIE Digital Library, and made available to others in the international scientific community who seek to learn, make discoveries, and innovate.

We invite you to join your colleagues and share the most recent developments and applications at SPIE Optical Metrology 2021.

Symposium Chairs

Marc P. Georges Marc P. Georges
Univ. de Liège (Belgium)
Jorg Seewigkl Jörg Seewig
Technische Univ. Kaiserslautern (Germany)

Technical Committee

Armando Albertazzi Goncalves, Jr., Univ. Federal de Santa Catarina (Brazil)
Bryan M. Barnes, National Institute of Standards and Technology (United States)
Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung IOSB and Karlsruher Institut für Technologie (Germany)
Bernd Bodermann, Physikalisch-Technische Bundesanstalt (Germany)
Pietro Ferraro, CNR - Institute of Applied Sciences and Intelligent Systems (Italy)
Karsten Frenner, Univ. Stuttgart (Germany)
Simonetta Grilli, CNR - Institute of Applied Sciences and Intelligent Systems (Italy)
Roger Groves, Technische Univ. Delft (Netherlands)
Michael Heizmann, Karlsruher Institut für Technologie (Germany)
Christoph Hitzenberger, Medizinische Univ. Wien (Austria)
Peter Lehmann, Univ. Kassel (Germany)
Haida Liang, Nottingham Trent Univ. (United Kingdom)
Wolfgang Osten, Univ. Stuttgart (Germany)
Monika Ritsch-Marte, Medizinische Univ. Innsbruck (Austria)
Ettore Stella, Univ. de Bari and CNR - Institute of Applied Sciences and Intelligent Systems (Italy)



Important Dates

Abstracts due
Extended to 1 February 2021

Author notification
9 March 2021

Manuscripts due
21 May 2021


Browse Defense, Security, and Sensing 2011 papers


Receive email updates about SPIE Optical Metrology