• Optical Metrology
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Internationales Congress Center
Munich, Germany
24 - 27 June 2019
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Due Dates and SPIE Contacts

Abstract Due Date: 9 January 2019

Author Notification: 26 February 2019

For questions about your presentation or the meeting, please contact Alex P. Rusova, your SPIE Conference Programs Coordinator.

Manuscript Due Date for Onsite Proceedings Volumes: 17 April 2019

Manuscript Due Date for Post-Meeting Volumes: 29 May 2019

Important Dates

Abstracts due
9 January 2019

Author notification
26 February 2019

Manuscripts due
onsite proceedings, conf OM101, OM102, OM104, OM105, OM106
17 April

Manuscripts due
post meeting proceedings, conf OM103
27 May

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