• Optical Metrology
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Internationales Congress Center
Munich, Germany
21 - 24 June 2021
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Information for Authors and Presenters

Information for Optical Metrology authors and presenters

Find where your research fits best – browse the conference topics to find a conference that most closely matches the topics in your abstract. 

Ready to submit your research? View Submission Guidelines

VIEW TOPICS IN:
Optical Metrology ›
  Call for Papers PDF

Important Dates

Abstracts due
6 January 2021

Author notification
26 February 2021

Manuscripts due
onsite proceedings, conf OM101, OM102, OM104, OM105, OM106
14 April 2021

Manuscripts due
post meeting proceedings, conf OM103
19 May 2021

Important Dates

Abstracts Submission Deadline 6 January 2021
Acceptance Notification Sent to Contact Author 26 February 2021
Manuscripts Due (onsite proceedings, conf OM101, OM102, OM104, OM105, OM106) 14 April 2021
Manuscripts Due (post meeting proceedings, conf OM103) 19 May 2021

Prepare to Present at the Conference

• Apply for a visa and/or request an invitation letter

• Apply for an SPIE Student Author Travel Grant 

• Prepare poster presentations: Poster Presentation Guidelines

• Prepare and upload oral presentations: Oral Presentation Guidelines and Upload Instructions

• View the SPIE Anti-Harassment Policy and SPIE Code of Conduct

• Register for the conference.


Presentation Questions? Contact the Program Coordinator (listed in your SPIE.org account)

Present a Better Paper

Prepare to make the best presentation – take one of these online courses from SPIE:

• Making the Most of Your Presentation

• Structuring Your Research Paper

These courses are free for SPIE Members.

Prepare and Submit your Manuscript

• SPIE Manuscript Submission Guidelines

Manuscript Questions? Contact the Proceedings Coordinator (listed in SPIE.org account)