• Optical Metrology
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Internationales Congress Center
Munich, Germany
24 - 27 June 2019
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Important Dates

Abstracts due
9 January 2019

Author notification
26 February 2019

Manuscripts due
onsite proceedings, conf OM101, OM102, OM104, OM105, OM106
17 April

Manuscripts due
post meeting proceedings, conf OM103
27 May

Browse Defense, Security, and Sensing 2011 papers

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