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Pacifico Yokohama
Yokohama, Japan
14 - 19 June 2020
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Astronomical Telescopes + Instrumentation 2020 in Yokohama, Japan

SPIE Astronomical Telescopes + Instrumentation in Yokohama, Japan, 14–19 June 2020

Now accepting abstract submissions
SPIE Astronomical Telescopes + Instrumentation, the most prestigious event for developers of ground- and space-based telescopes, the supporting technologies, and the latest instrumentation. Join your peers at the this important conference focused on astrophotonics.

Ensure you get information about this event. Unless you opt in to receive emails, you may not be sent info about SPIE Astronomical Telescopes and Instrumentation. Sign up to receive notifications.

Download Call for Papers PDF

Abstracts Due
13 November 2019

Author Notification
23 February 2020

Manuscripts Due
16 May 2020

Explore the topics to see where to submit your research

Telescopes and Systems

Space Telescopes and Instrumentation: Optical, Infrared, and Millimeter Wave
Space Telescopes and Instrumentation: Ultraviolet to Gamma Ray
Ground-based and Airborne Telescopes
Optical and Infrared Interferometry and Imaging
Ground-based and Airborne Instrumentation for Astronomy
Adaptive Optics Systems
Observatory Operations: Strategies, Processes, and Systems
Modeling, Systems Engineering, and Project Management for Astronomy


Technology Advancements

Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation
Software and Cyberinfrastructure for Astronomy
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy
High Energy, Optical, and Infrared Detectors for Astronomy

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Proceedings of SPIE

SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 

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