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Pacifico Yokohama
Yokohama, Japan
14 - 19 June 2020
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Astronomical Telescopes + Instrumentation 2020 in Yokohama, Japan

SPIE Astronomical Telescopes + Instrumentation in Yokohama, Japan, 14–19 June 2020

SPIE Astronomical Telescopes + Instrumentation, the most prestigious event for developers of ground- and space-based telescopes, the supporting technologies, and the latest instrumentation. Join your peers at the this important conference focused on astrophotonics.

Stay informed and ensure you get information about this event. Unless you opt in to receive emails, you may not be sent info about SPIE Astronomical Telescopes and Instrumentation. Registration opens in February 2020. 

Abstracts Due
13 November 2019

Author Notification
24 February 2020

Manuscripts Due
18 May 2020

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Explore the 2020 topics

Telescopes and Systems

• Space Telescopes and Instrumentation: Optical, Infrared, and Millimeter Wave
• Space Telescopes and Instrumentation: Ultraviolet to Gamma Ray
• Ground-based and Airborne Telescopes
• Optical and Infrared Interferometry and Imaging
• Ground-based and Airborne Instrumentation for Astronomy
• Adaptive Optics Systems
• Observatory Operations: Strategies, Processes, and Systems
• Modeling, Systems Engineering, and Project Management for Astronomy

  

Technology Advancements

• Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation
• Software and Cyberinfrastructure for Astronomy
• Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy
• High Energy, Optical, and Infrared Detectors for Astronomy

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Proceedings of SPIE

SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 

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