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Scanning Microscopies 2014
Editor(s): Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel
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Volume Details

Volume Number: 9236
Date Published: 23 October 2014

Table of Contents
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Front Matter: Volume 9236
Author(s): Proceedings of SPIE
3D Monte Carlo modeling of the SEM: Are there applications to photomask metrology?
Author(s): J. S. Villarrubia; A. E. Vladár; M. T. Postek
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A novel approach for scanning electron microscopic observation in atmospheric pressure
Author(s): Yusuke Ominami; Kenji Nakahira; Shinsuke Kawanishi; Tatsuo Ushiki; Sukehiro Ito
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Does your SEM really tell the truth? How would you know? part 3: vibration and drift
Author(s): Michael T. Postek; András E. Vladár; Petr Cizmar
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Investigations on CMOS photodiodes using scanning electron microscopy with electron beam induced current measurements
Author(s): A. Kraxner; F. Roger; B. Loeffler; M. Faccinelli; S. Kirnstoetter; R. Minixhofer; P. Hadley
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A novel transmission electron imaging technique for observation of biological samples on a plate
Author(s): Yusuke Ominami; Masato Nakajima M.D.; Tatsuo Ushiki M.D.; Sukehiro Ito
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Three-dimensional surface reconstruction using scanning electron microscopy and the design of a nanostructured electron trap
Author(s): Renke Scheuer; Eduard Reithmeier
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Shear force microscopy using piezoresistive cantilevers in surface metrology
Author(s): Teodor Gotszalk; Daniel Kopiec; Andrzej Sierakowski; Paweł Janus; Piotr Grabiec; Ivo W. Rangelow
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High throughput data acquisition with a multi-beam SEM
Author(s): Anna Lena Keller; Dirk Zeidler; Thomas Kemen
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On the limits of miniature electron column technology
Author(s): Lawrence Muray; James Spallas; Dan Meisburger
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Assessing the viability of multi-electron beam wafer inspection for sub-20nm defects
Author(s): Brad Thiel; Michael Lercel; Benjamin Bunday; Matt Malloy
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Rigorous quantitative elemental microanalysis by scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) with spectrum processing by NIST DTSA-II
Author(s): Dale E. Newbury; Nicholas W. M. Ritchie
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First experiences with 2D-mXRF analysis of gunshot residue on garment, tissue, and cartridge cases
Author(s): Alwin Knijnenberg; Amalia Stamouli; Martin Janssen
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Developing a quality assurance program for gunshot primer residue analysis
Author(s): Thomas R. White
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An electro-conductive organic coating for scanning electron microscopy (déjà vu)
Author(s): Bryan R. Burnett
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Using the Hitachi SEM to engage learners and promote next generation science standards inquiry
Author(s): D. E. Menshew
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Integrating electron microscopy into nanoscience and materials engineering programs
Author(s): Robert D. Cormia; Michael M. Oye; Anh Nguyen; David Skiver; Meng Shi; Yessica Torres
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Teaching K-12 teachers and students about nanoscale science through microscopy
Author(s): Nancy Healy
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Project NANO (nanoscience and nanotechnology outreach): a STEM training program that brings SEM's and stereoscopes into high-school and middle-school classrooms
Author(s): Sherry L. Cady; Mikel Blok; Keith Grosse; Jennifer Wells
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Design, technology, and application of integrated piezoresistive scanning thermal microscopy (SThM) microcantilever
Author(s): Paweł Janus; Piotr Grabiec; Andrzej Sierakowski; Teodor Gotszalk; Maciej Rudek; Daniel Kopiec; Wojciech Majstrzyk; Guillaume Boetsch; Bernd Koehler
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Particle deformation induced by AFM tapping under different setpoint voltages
Author(s): Chung-Lin Wu; Natalia Farkas; John A. Dagata; Bo-Ching He; Wei-En Fu
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Wavelet transform-based method of compensating dispersion for high resolution imaging in SDOCT
Author(s): Haiyi Bian; Wanrong Gao
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Scan mirrors relay for high resolution laser scanning systems
Author(s): David Kessler
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Using scanning near-field microscopy to study photo-induced mass motions in azobenzene containing thin films
Author(s): A. D. Vu; F. Fabbri; N. Desboeufs; J.-P. Boilot; T. Gacoin; K. Lahlil; Y. Lassailly; L. Martinelli; J. Peretti
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Nanoscale imaging by micro-cavity scanning microscopy
Author(s): Andrea Di Donato; Gianluca Ippoliti; Tullio Rozzi; Davide Mencarelli; Giuseppe Orlando; Marco Farina
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A compact physical CD-SEM simulator for IC photolithography modeling applications
Author(s): Chao Fang; Mark D. Smith; Alessandro Vaglio Pret; John J. Biafore; Stewart A. Robertson; Joost Bekaert
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A tale of three trials: from science to junk science
Author(s): Bryan R. Burnett
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Do electron flux and solar x-ray in juxtaposition prior a seismic event make signature?
Author(s): Umesh Prasad Verma; Madhurendra Nath Sinha
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Confirmatory analysis of field-presumptive GSR test sample using SEM/EDS
Author(s): Sarah J. Toal; Wayne D. Niemeyer; Sean Conte; Daniel D. Montgomery; Gregory S. Erikson
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