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Reliability of Photovoltaic Cells, Modules, Components, and Systems VII
Editor(s): Neelkanth G. Dhere
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Volume Details

Volume Number: 9179
Date Published: 4 November 2014

Table of Contents
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Front Matter: Volume 9179
Author(s): Proceedings of SPIE
International PV QA Task Force's proposed comparative rating system for PV modules
Author(s): John Wohlgemuth; Sarah Kurtz
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Japanese Task Group 8 activities in international PV module quality assurance
Author(s): Keiichiro Sakurai; Akihiro Takano; Hironori Yanase; Toshiaki Sakai; Hironori Nishihara; Tetsuro Nakamura; Shinji Fujikake; Masayoshi Takani
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Statistical analysis of degradation modes and mechanisms in various thin-film photovoltaic module technologies
Author(s): Eric Schneller; Narendra S. Shiradkar; Camila L. Pereira; Leandro C. Fonseca; Neelkanth G. Dhere
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Analysis of the degradation and aging of a commercial photovoltaic installation
Author(s): Alexander Bradley; Babak Hamzavy; William Gambogi
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Comparison of environmental degradation in Hanwha 295 W and SunPower 320 W photovoltaic modules via accelerated lifecycle testing
Author(s): R. Biggie; T. Lai; W.-J. Huang; B. G. Potter Jr.; K. Simmons-Potter
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Outdoor performance of CIGS modules in different climates
Author(s): Kristopher Toivola; Paul F. Robusto; Ajay Saproo; Bill Kessler
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Effect of shading on the switching of bypass diodes in PV modules
Author(s): Narendra Shiradkar; Eric Schneller; Neelkanth Dhere; Vivek Gade
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Angle of incidence effects on soiled PV modules
Author(s): J. John; V. Rajasekar; S. Boppana; S. Tatapudi; G. Tamizhmani
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Reliability of hybrid photovoltaic DC micro-grid systems for emergency shelters and other applications
Author(s): Neelkanth G. Dhere; Susan Schleith
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Research, test, and development activities performed by junction box bypass diode task force # 4
Author(s): Vivek Gade; Narendra Shiradkar; Paul Robusto; Kent Whitfield; John Wohlgemuth; Yasunori Uchida; Neelkanth G. Dhere
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Accelerated performance degradation of CIGS solar cell determined by in-situ monitoring
Author(s): Mirjam Theelen; Nicolas Barreau; Felix Daume; Henk Steijvers; Vincent Hans; Aikaterini Liakopoulou; Zeger Vroon; Miro Zeman
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Thermal performance of microinverters on dual-axis trackers
Author(s): Mohammad A. Hossain; Timothy J. Peshek; Yifan Xu; Liang Ji; Jiayang Sun; Alexis Abramson; Roger H. French
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The influence of atmospheric species on the degradation of aluminum doped zinc oxide and Cu(In,Ga)Se2 solar cells
Author(s): Mirjam Theelen; Christopher Foster; Supratik Dasgupta; Zeger Vroon; Nicolas Barreau; Miro Zeman
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Quantifying PV module microclimates and translation into accelerated weathering protocols
Author(s): Nancy H. Phillips; Kurt P. Scott
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Predicting edge seal performance from accelerated testing
Author(s): Kedar Hardikar; Dan Vitkavage; Ajay Saproo; Todd Krajewski
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Effect of UV aging on degradation of Ethylene-vinyl Acetate (EVA) as encapsulant in photovoltaic (PV) modules
Author(s): Amir Badiee; Ricky Wildman; Ian Ashcroft
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Optical properties of PV backsheets: key indicators of module performance and durability
Author(s): Thomas C. Felder; William J. Gambogi; James G. Kopchick; R. Scott Peacock; Katherine M. Stika; T. John Trout; Alexander Z. Bradley; Babak Hamzavytehrany; Abdulkerim Gok; Roger H. French; Oakland Fu; Hongjie Hu
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Device to analyze leakage current pathways in photovoltaic modules in real-time
Author(s): Neelkanth Dhere; Narendra Shiradkar; Eric Schneller
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Chemical depth profiling of photovoltaic backsheets after accelerated laboratory weathering
Author(s): Chiao-Chi Lin; Peter J. Krommenhoek; Stephanie S. Watson; Xiaohong Gu
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Junction box wiring and connector durability issues in photovoltaic modules
Author(s): Juris Kalejs
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Combined-environment influence on microcrack evolution in mono-crystalline silicon
Author(s): W.-J. Huang; Z. D. Fortuno; M. Li; J. Liu; H. Liao; K. Simmons-Potter; B. G. Potter Jr.
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The vital role of manufacturing quality in the reliability of PV modules
Author(s): Peter Rusch
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A review of manufacturing metrology for improved reliability of silicon photovoltaic modules
Author(s): Kristopher O. Davis; Joseph Walters; Eric Schneller; Hubert Seigneur; R. Paul Brooker; Giuseppe Scardera; Marianne P. Rodgers; Nahid Mohajeri; Narendra Shiradkar; Neelkanth G. Dhere; John Wohlgemuth; Andrew C. Rudack; Winston V. Schoenfeld
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