Share Email Print


Reflection, Scattering, and Diffraction from Surfaces III
Editor(s): Leonard M. Hanssen
For the purchase of this volume in printed format, please visit

Volume Details

Volume Number: 8495
Date Published: 27 September 2012

Table of Contents
show all abstracts | hide all abstracts
Front Matter: Volume 8495
Author(s): Proceedings of SPIE
Domain of validity of the equation for total integrated scatter (TIS)
Author(s): James E. Harvey; Narak Choi
Show Abstract
Upper roughness limitations on the TIS/RMS relationship
Author(s): John C. Stover; Sven Schröder; Thomas A. Germer
Show Abstract
Comparison of the domain of validity of several approximate surface scatter theories
Author(s): Narak Choi; James E. Harvey
Show Abstract
Converting surface roughness data into PSD and BSDF
Author(s): Richard N. Pfisterer
Show Abstract
Design of combined microscopical and scatterometrical imaging device of surface inspection
Author(s): Wenjing Zhao; Cornelius Hahlweg; Hendrik Rothe
Show Abstract
Backscatter based projectile trajectory measurement under daylight conditions
Author(s): Uwe Chalupka; Hendrik Rothe
Show Abstract
Surface characterization using combined analysis of original and scatter image
Author(s): Wenjing Zhao; Cornelius Hahlweg; Hendrik Rothe
Show Abstract
Inter-laboratory comparison using integrating sphere spectrophotometers to measure reflectance and transmittance of specular, diffuse, and light-redirecting glazing products
Author(s): Jacob C. Jonsson; Charlie Curcija
Show Abstract
Comparison of NRC goniometric and integrating sphere methods for realizing an absolute diffuse reflectance scale
Author(s): Réjean Baribeau; Joanne Zwinkels
Show Abstract
Effective medium analysis on the optical properties of silicon nanowire arrays
Author(s): Han Wang; Xianglei Liu; Liping Wang; Zhuomin Zhang
Show Abstract
Estimating hemispherical scatter from incident plane measurements of isotropic samples
Author(s): John C. Stover; Sven Schröder; Alexander von Finck; Angela Duparré
Show Abstract
A BRDF model for scratches and digs
Author(s): Gary L. Peterson
Show Abstract
Surface-plasmon mediated near-field light diffraction
Author(s): Danhong Huang; L. David Wellems
Show Abstract
How accurate is the Kubelka-Munk theory of diffuse reflection? A quantitative answer
Author(s): Richard I. Joseph; Michael E. Thomas
Show Abstract
Tunable supercontinuum fiber laser source for BRDF measurements in the STARR II gonioreflectometer
Author(s): Heather J. Patrick; Clarence J. Zarobila; Thomas A. Germer; Victor A. Ying; Catherine A. Cooksey; Benjamin K. Tsai
Show Abstract
Scatterometer basing on a STAR GEM idea for optical measurements of microlenses
Author(s): Etsuo Kawate; Miroslav Hain
Show Abstract
The Southwest Research Institute ultraviolet reflectance chamber (SwURC): a far ultraviolet reflectometer
Author(s): Gregory S. Winters; Kurt D. Retherford; Michael W. Davis; Stephen M. Escobedo; Eric C. Bassett; Edward L. Patrick; Maggie E. Nagengast; Matthew H. Fairbanks; Paul F. Miles; Joel W. Parker; G. Randall Gladstone; David C. Slater; S. Alan Stern
Show Abstract
The focusing of light scattered from diffuse reflectors using phase modulation
Author(s): Jessica M. Schafer; Michael A. Marciniak
Show Abstract
Scattering computation for 3D laser imagery and reconstruction algorithms
Author(s): Ion Berechet; Gérard Berginc; Stefan Berechet
Show Abstract
Matrix determination of hidden object reflectance by indirect photography
Author(s): Simon S. Ferrel; Michael A. Marciniak
Show Abstract
Measuring grazing-angle DHR with the infrared grazing angle reflectometer
Author(s): Michael R. Benson; Michael A. Marciniak; Jeffrey W. Burks
Show Abstract
Advanced gloss sensing for robotic applications
Author(s): Christian Deinhammer; Markus Brandner
Show Abstract
Sophisticated light scattering techniques from the VUV to the IR regions
Author(s): Sven Schröder; Marcus Trost; Tobias Herffurth; Alexander von Finck; Angela Duparré
Show Abstract
Effects of a measurement floor on Mueller matrix measurements in a DRR BSDF system
Author(s): Stephen E. Nauyoks; Michael A. Marciniak
Show Abstract
Using differential ray tracing in stray light analysis
Author(s): David F. Rock
Show Abstract
Optical non-contact micrometer thickness measurement system for silica thick films
Author(s): K. Thambiratnam; H. Ahmad; M. Yasin; A. Z. Zulkifli; S. W. Harun
Show Abstract
Extensive goniometric spectral measurements at desert sites for military engineering
Author(s): T. E. Berry Jr.; J. C. Morgan; J. S. Furey; T. A. DeMoss; J. R. Kelley; J. R. McKenna
Show Abstract
Optimized diffusers for reflective mirasol displays: experience from metrology characterization
Author(s): Evgeni Y. Poliakov; Russel A. Martin; Ion Bita; Matthew Sampsell
Show Abstract
Roughness evaluation of very smooth surfaces using a novel method of scatter measurement
Author(s): Romuald Synak; Wlodzimierz Lipinski; Marcin Pawelczak
Show Abstract
Reflectance variability of surface coatings reveals characteristic eigenvalue spectra
Author(s): José M. Medina; José A. Díaz; Rui Barros
Show Abstract
Homogeneity measurements of hardness standards with a nondestructive optical method
Author(s): Jose G. Suarez-Romero; Eduardo Hernandez-Gomez; Juan B. Hurtado-Ramos
Show Abstract
A fast and accurate surface plasmon resonance system
Author(s): Y. M. Espinosa Sánchez; D. Luna Moreno; E. Noé Arias; G. Garnica Campos
Show Abstract
Electromagnetic scattering in the open elliptic quantum billiard
Author(s): Hipolito Garcia-Gracia; Julio C. Gutiérrez-Vega
Show Abstract

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?