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Two- and Three-Dimensional Methods for Inspection and Metrology IV
Editor(s): Peisen S. Huang

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Volume Details

Volume Number: 6382
Date Published: 11 October 2006

Table of Contents
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Recent trends in white-light interferometry
Author(s): Katsuichi Kitagawa
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Toward online non-contact roughness profile measurements with a sensor based on conoscopic holography: current developments
Author(s): Ignacio Álvarez; Jorge Marina; José M. Enguita; César Fraga; Ricardo García; Guillermo Ojea
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White light displacement sensor by spectro-polarization modulator
Author(s): Yukitoshi Otani; Toshitaka Wakayama; Dmitry Orlov; Norihiro Umeda; Toru Yoshizawa
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Optical crack following on tunnel surfaces
Author(s): Gerhard Paar; Maria d. P. Caballo-Perucha; Heiner Kontrus; Oliver Sidla
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Optical inspection of holes in jet engine blades
Author(s): Devdas Shetty; Tom A. Eppes; Nikolay Nazaryan; Jun Kondo; Claudio Campana
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3D vision methods and selected experiences in micro and macro applications
Author(s): H. Hügli; J. Mure-Dubois
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Passive range measurement through wavefront coding
Author(s): Steven A. Lis
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Regularization of the deflectometry problem using shading data
Author(s): Jonathan Balzer; Stefan Werling; Jürgen Beyerer
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Edge measurement using stereovision and phase-shifting methods
Author(s): Qingying Hu; Kevin Harding; Don Hamilton
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Inner profile measurement of pipes and holes using a ring beam device
Author(s): Toru Yoshizawa; Masayuki Yamamoto; Toshitaka Wakayama
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Depth-from-defocus: blur equalization technique
Author(s): Tao Xian; Murali Subbarao
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Accuracy problems in phase shift based 3D machine vision inspection systems
Author(s): Igor Dunin-Barkowski; Jae-Seon Kim
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Metric projector camera calibration for measurement applications
Author(s): Jan W. Horbach; Thao Dang
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On improving the accuracy of structured light systems
Author(s): Peisen S. Huang; Xu Han
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Automated geometry measurement of wheel rims based on optical 3D metrology
Author(s): Christian Teutsch; Dirk Berndt; Nico Schmidt; Erik Trostmann
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Embedded 3D vision system for automated micro-assembly
Author(s): James Mure-Dubois; Heinz Hügli
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Multiresolution 3D measurement using a hybrid fringe projection and moire approach
Author(s): Kevin Harding; Qingying Hu
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An improved achromatic half-wave plate phase shifter for white light interferometry
Author(s): Suja Helen Simson; Mahendra Prasad Kothiyal; Rajpal Singh Sirohi
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A flexible photogrammetric stereo vision system for capturing the 3D shape of extruded profiles
Author(s): Christian Teutsch; Dirk Berndt; Andreas Sobotta; Silvio Sperling
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Dynamic out-of-plane profilometry for nanoscale full field characterization of MEMS with automatic detection of vibratory modes and MHz-scale measurement bandwidth
Author(s): Liang-Chia Chen; Huang-Wen Lai; Calvin C. Chang; Yao-Ting Huang; Jin-Liang Chen
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Stereovision-based vegetable row recognition algorithm for agricultural vehicles
Author(s): Fangming Zhang; Tong Sun; Yibin Ying
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Optical on-line product inspection system and its application
Author(s): Weimin Sun; Yang Yang; Zhilin Zhang; Haili Jiang; Xiaoli Wang
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Image enhancement for phase shift analysis sensors
Author(s): Gil Abramovich; Kevin Harding; Ralph Isaacs; Matthew Radebach; Kevin Kenny; Zhaohui Sun; Joe Ross; Ming Jia; Li Tao; Guiju Song; Jianming Zheng; Martha Gardner; Dirk Padfield
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