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Noise in Devices and Circuits III
Editor(s): Alexander A. Balandin; Francois Danneville; M. Jamal Deen; Daniel M. Fleetwood

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Volume Details

Volume Number: 5844
Date Published: 23 May 2005

Table of Contents
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A physical understanding of the noise performance of MOS transistors for wireless and lightwave applications in the giga-bit regime
Author(s): R. P. Jindal
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Low frequency noise in SOI transistors
Author(s): Tony Tseng; J. C. S. Woo
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Flicker noise in nitrided high-k dielectric NMOS transistors
Author(s): Bigang Min; Siva Prasad Devireddy; Zeynep Celik Butler; Ajit Shanware; Keith Green; J. J. Chambers; M. V. Visokay; Luigi Colombo; A. L. P. Rotondaro
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Trap competition inducing R.T.S noise in saturation range in N-MOSFETs
Author(s): C. Leyris; A. Hoffmann; M. Valenza; J.-C. Vildeuil; F. Roy
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Hot carrier effects on jitter and phase noise in CMOS voltage-controlled oscillators
Author(s): Chi Zhang; Ashok Srivastava
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1/f noise in SOI buried oxides and alternative dielectrics to SiO2
Author(s): Daniel M. Fleetwood; Hao D. Xiong; Jonathan S. Lin
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Low frequency noise of light emitting diodes
Author(s): S. L. Rumyantsev; S. Sawyer; N. Pala; M. S. Shur; Yu. Bilenko; J. P. Zhang; X. Hu; A. Lunev; J. Deng; R. Gaska
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Low-frequency noise measurements used for semiconductors light active devices
Author(s): Jiri Vanek; Zdenek Chobola; Vladimir Brzokoupil; Jiri Kazelle
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Studying the dependence of low-frequency noise on geometrical shape of Al-based thin film interconnects
Author(s): Kuldeep S. Rawat; Gholam H. Massiha; Jayanta Choudhury
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Noise in SiGe HBTs: opportunities and challenges
Author(s): John D. Cressler
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Comparison of 1/f noise in complementary NPN and PNP polysilicon emitter bipolar transistors
Author(s): Md Mazhar Ul Hoque; Zeynep Celik-Butler; Joe Trogolo; Douglas Weiser; Keith Green
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Investigating the differences in low-frequency noise behavior of npn and pnp SiGe HBTs fabricated in a complementary SiGe HBT BiCMOS on SOI technology
Author(s): Enhai Zhao; Ramkumar Krithivasan; Akil K. Sutton; Zhenrong Jin; John D. Cressler; Badih El-Kareh; Scott Balster; Hiroshi Yasuda
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Anomalous low-frequency noise behavior in 210 GHz SiGe HBTs
Author(s): Zhenrong Jin; Jarle A. Johansen; John D. Cressler; Alvin J. Joseph
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Noise behavior of a PNP- and NPN-type SiGe HBT: a simulation study
Author(s): B. Neinhues; C. Jungemann; B. Meinerzhagen
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Nano device for monitoring electrical fluctuations on bacterial scale
Author(s): Sungkyu Seo; Jong Kim; Maria Dobozi-King; Ryland F. Young; Sergey M. Bezrukov; Laszlo B. Kish; Mosong Cheng
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Nanoscale MOS devices: device parameter fluctuations and low-frequency noise
Author(s): Hei Wong; Hiroshi Iwai; J. J. Liou
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Different noise mechanisms in high-k dielectric gate stacks
Author(s): Zeynep Celik-Butler
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High frequency noise of SOI MOSFETs: performances and limitations
Author(s): Francois Danneville; Guillaume Pailloncy; Alexandre Siligaris; Benjamin Iniguez; Gilles Dambrine
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Low-frequency noise parameter extraction in poly-Si thin-film transistors
Author(s): Hyungdo Nam; Hae-Suk Yang; Jungil Lee; Alain Chovet; Bela Szentpali; Eunkyu Kim
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Flicker noise characteristics of MOSFETs with HfO2, HfAlOx, and Al2O3/HfO2 gate dielectrics
Author(s): Siva Prasad Devireddy; Bigang Min; Zeynep Celik-Butler; Fang Wang; Ania Zlotnicka; Hsing-Huang Tseng; Philip J. Tobin
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MOSFET 1/f noise under switched bias conditions
Author(s): Michael Y. Louie; L. Forbes
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Why did Intel fail with 60 nanometers? Reiteration of the noise, information, speed, and heat aspects of the breakdown of Moore's Law
Author(s): Laszlo B. Kish; Yingfeng Li
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A combined noise analysis and power supply current based testing of CMOS analog integrated circuits
Author(s): Ashok Srivastava; Vani K. Pulendra; Siva Yellampalli
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Analysis and simulation of noise in correlated double sampling imager circuits
Author(s): Leonard Forbes; Harish Gopalakrishnan; Weetit Wanalertlak
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Physics of GaN devices
Author(s): Michael S. Shur
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Characterization of 1/f noise in GaN-based HEMTs under high dc voltage stress
Author(s): S. K. Jha; C. F. Zhu; E. Jelenkovic; K. Y. Tong; C. Surya; H. Schweizer; M. Pilkuhn
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Investigation of the trap states and their effect on the low-frequency noise in GaN/AlGaN HFETs
Author(s): W. L. Liu; Y. L. Chen; A. A. Balandin; K. L. Wang
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A simple noise modeling based testing of CMOS analog integrated circuits
Author(s): Siva Yellampalli; Ashok Srivastava
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A sampling wattmeter for noise power measurements
Author(s): Luca Callegaro; Marco Pisani
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Exploiting metastability and thermal noise to build a reconfigurable hardware random number generator
Author(s): Daihyun Lim; Damith C. Ranasinghe; Srinivas Devadas; Behnam Jamali; Derek Abbott; Peter H. Cole
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Energy barriers, demons, and minimum energy operation of electronic devices
Author(s): Ralph K. Cavin III; Victor V. Zhirnov; James A. Hutchby; George I. Bourianoff
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