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Advances in Thin Film Coatings for Optical Applications

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Volume Details

Volume Number: 5527
Date Published: 29 September 2004

Table of Contents
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Computer-assisted manual coating design approach
Author(s): William H. Southwell
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Exact synthesis of dielectric thin film filters
Author(s): Agnieszka Rowinska-Schwarzweller; Norbert Fruehauf
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Anomalous phase in one-dimensional multilayer periodical structures with birefringent materials
Author(s): Antonio Mandatori; Concita Sibilia; Mario Bertolotti; S. Zhukovsky; Joseph W. Haus; Michael Scalora
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Optical coatings for gravitational wave detection
Author(s): Gregory M. Harry; Helena Armandula; Eric Black; David R.M. Crooks; Gianpietro Cagnoli; Martin M. Fejer; Jim Hough; Steven D. Penn; Sheila Rowan; Roger Route; Peter Sneddon
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Thermal fields in multimode laser-metallic thin film interaction
Author(s): Mihai Oane; Ion G. Morjan; Rares V. Medianu
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Ion-assist applications of broad-beam ion sources
Author(s): Harold R. Kaufman; James M.E. Harper
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Developments in energetic processes for optical coating applications
Author(s): Michael L. Fulton
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High-performance antireflection coatings for telecommunications
Author(s): Ian C. Stevenson
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Investigation of damage threshold of ion beam deposited oxide thin film optics for high-peak-power short-pulse lasers
Author(s): Ann M. Fitzgerald Dummer; Fernando Brizuela; Charissa Duskis; Brad Luther; Miguel Larotonda; Jorge J. Rocca; Jason George; Sandeep Kohli; Pat McCurdy; Carmen S. Menoni
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High-temperature film thickness sensors for CVD process control
Author(s): Scott F. Grimshaw
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Study on adhesion of thin film coatings of polypyrrole on glass substrate for mechanical durability of sensor devices
Author(s): Lalitkumar Bansal; Mahmoud El-Sherif
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Characterization of C70 doped poly(styrene) –b- poly(hexyl methacrylate) (PS-PHMA) thin film on c–Si substrate with a Jobin Yvon UVISEL phase- modulated spectroscopic ellipsometer (PMSE).
Author(s): Alan Richard Kramer; Nan Yao; Vincent Pelletier
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Chalcogenide-based system and its thin films for phase change optical data storage
Author(s): Yagya Deva Sharma; Promod K. Bhatnagar
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Study of the oxidization of ns-SiNx:H thin films using FTIR phase modulated ellipsometry
Author(s): Jordi Sancho-Parramon; Salvador Bosch; Albert Pinyol; Enric Bertran; Adolf Canillas
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Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O
Author(s): Ivan Ohlidal; Miloslav Ohlidal; Daniel Franta; Vladimir Cudek; Vilma Bursikova; Martin Siler
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Design of reflection-retarders using non-negative film-substrate systems
Author(s): A. R. M. Zaghloul; Jamie Scott Mason
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