Share Email Print


Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 4703
Date Published: 7 June 2002

Table of Contents
show all abstracts | hide all abstracts
Determination of mechanical properties of superhard amorphous, nanocrystalline, and microcrystalline materials by laser-based surface acoustic waves
Author(s): Peter Hess
Show Abstract
NDE of zinc layer on steel substrate using laser-ultrasonic SAW
Author(s): Bouzid Chenni; Andre Moreau; J. Pouliquen
Show Abstract
Measurement and simulation of the laser-based thermo-elastic excitation and propagation of acoustic pulses for thin film and MEMS inspection
Author(s): Dieter Michael Profunser; Jacqueline Vollmann; Jurg Bryner; Jurg Dual
Show Abstract
Nondestructive evaluation of bonding characteristics of TiO2-Al2O3 gas sensor
Author(s): Bin Feng; Golam Newaz; Gregory W. Auner; Sheikh Akbar; A. Merhaba
Show Abstract
In-situ x-ray reflectivity measurement of the interface roughness of tantalum pentoxide thin film during rf magnetron sputtering deposition
Author(s): Chih-Hao Lee; Tzu-Wen Huang; Hsin-Yi Lee; Yung-Wei Hsieh
Show Abstract
Subsurface detection and characterization of Hertzian cracks in advanced ceramic materials using optical coherence tomography
Author(s): Mark Bashkansky; John F. Reintjes
Show Abstract
Atomic force acoustic microscopy at ultrasonic frequencies
Author(s): Walter Arnold; S. Hirsekorn; Malgorzata Kopycinska-Mueller; Ute Rabe; Michael Reinstaedtler; V. Scherer
Show Abstract
Quantitative elastic-property information with acoustic AFM: measurements and modeling
Author(s): Donna C. Hurley; Joshua S. Wiehn; Joseph A. Turner; Paul Rice
Show Abstract
Nonlinear vibrations in atomic force microscopy
Author(s): Joseph A. Turner
Show Abstract
Ultrasonic atomic force microscopy with real-time mapping of resonance frequency and Q factor
Author(s): Kazushi Yamanaka; Hiroshi Irihama; Toshihiro Tsuji; Keiichi Nakamoto
Show Abstract
Finite element simulations of nonlinear vibrations of atomic force microscope cantilevers
Author(s): Kangzhi Shen; Joseph A. Turner
Show Abstract
Improving atomic force microscopy images with the adaptation of ultrasonic force microscopy
Author(s): Carl J. Druffner; Shamachary Sathish
Show Abstract
Micro Materials Center Berlin: reliability research for MEMS
Author(s): Bernd Michel; Thomas Winkler
Show Abstract
Damage detection and characterization in smart CFRP composites
Author(s): Gerhard Mook; Juergen Pohl; Fritz Michel; Sven Herold
Show Abstract
Characterization of epoxy coating degradation using NDE imaging techniques
Author(s): Jochen Hoffmann; Victoria Kramb; Joel Johnson; Norbert Meyendorf
Show Abstract
Relations between crack opening behavior and crack tip diffraction of longitudinal wave
Author(s): Tsuyoshi Mihara; Masashi Nomura; Kazushi Yamanaka
Show Abstract
Characterization of miniaturized tensile specimens using micromagnetic techniques
Author(s): Henrik Roesner; Norbert Meyendorf
Show Abstract
Output signal prediction of an open-ended waveguide probe when scanning elliptically shaped cracks in metals
Author(s): Farhad Mazlumi; Hesam Sadeghi; R. Moini
Show Abstract
Accelerated life testing (ALT) in microelectronics and photonics: its role, attributes, challenges, pitfalls, and interaction with qualification tests
Author(s): Ephraim Suhir
Show Abstract
Microcharacterization of MEMS ultrasonic transducers using laser interferometry
Author(s): James L. Blackshire; Shamachary Sathish
Show Abstract
Micro- and nano-DAC: a powerful technique for nondestructive microcrack evaluation
Author(s): Bernd Michel; Dietmar Vogel
Show Abstract
Nondestructive characterization and application of doped and undoped polycrystalline diamond films
Author(s): Matthias Werner; Thomas Koehler; Stephan Mietke; Eckhard Woerner; Colin Johnston; Hans-Joerg Fecht
Show Abstract
Analytical modeling of flash thermography: results for a layered sample
Author(s): Matthias Goldammer; Joachim Baumann
Show Abstract
Diffusion-based thermal tomography
Author(s): Ronald A. Kline; William P. Winfree
Show Abstract

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?