### PROCEEDINGS VOLUME 4510

Charged Particle Detection, Diagnostics, and Imaging*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 4510

Date Published: 21 December 2001

Date Published: 21 December 2001

Table of Contents

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Neutron enhancement and related recent studies on the fast ignitor at ILE Osaka University

Author(s): Yoneyoshi Kitagawa; Ryosuke Kodama; Kazuo A. Tanaka; Yusuke Tohyama; Shin Akamatsu; Yasuhiko Sentoku; Hisanori Fujita; Takahisa Jitsuno; Hiroaki Nishimura; Shuji Sakabe; Yasukazu Izawa; Kunioki Mima; Tatsuhiko Yamanaka

Author(s): Yoneyoshi Kitagawa; Ryosuke Kodama; Kazuo A. Tanaka; Yusuke Tohyama; Shin Akamatsu; Yasuhiko Sentoku; Hisanori Fujita; Takahisa Jitsuno; Hiroaki Nishimura; Shuji Sakabe; Yasukazu Izawa; Kunioki Mima; Tatsuhiko Yamanaka

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CVD diamond detectors for current mode neutron time-of-flight spectroscopy at OMEGA/NIF

Author(s): Gregory J. Schmid; Vladimir Yu. Glebov; Allen V. Friensehner; Dana R. Hargrove; Steven P. Hatchett II; Nobuhiko Izumi; Richard A. Lerche; Thomas W. Phillips; Thomas Craig Sangster; Christopher T. Silbernagel; Christian Stoeckl

Author(s): Gregory J. Schmid; Vladimir Yu. Glebov; Allen V. Friensehner; Dana R. Hargrove; Steven P. Hatchett II; Nobuhiko Izumi; Richard A. Lerche; Thomas W. Phillips; Thomas Craig Sangster; Christopher T. Silbernagel; Christian Stoeckl

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High-spatial-resolution imaging system for high-energy neutrons in inertial confinement fusion experiments

Author(s): Olivier Delage; Tao Le; Nicolas Dague; Henri H. Arsenault; Richard A. Lerche; Thomas Craig Sangster; Nobuhiko Izumi; Paul A. Jaanimagi; Ray K. Fisher

Author(s): Olivier Delage; Tao Le; Nicolas Dague; Henri H. Arsenault; Richard A. Lerche; Thomas Craig Sangster; Nobuhiko Izumi; Paul A. Jaanimagi; Ray K. Fisher

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Neutron imaging system established at Rochester (NY): evaluation of the neutrons gamma signal noise ratio

Author(s): Christian Labbe

Author(s): Christian Labbe

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Optimizing photonuclear reactions with a high-intensity laser

Author(s): G. Malka; Marie Madeleine Aleonard; J. F. Chemin; G. Claverie; M. Harston; V. T. Tikhonchuk; J. N. Scheurer; S. Fritzler; Victor Malka; Philippe Balcou; G. Grillon; Stavros D. Moustaizis; L. Notebaert; M. Pittman; Erik Lefebvre

Author(s): G. Malka; Marie Madeleine Aleonard; J. F. Chemin; G. Claverie; M. Harston; V. T. Tikhonchuk; J. N. Scheurer; S. Fritzler; Victor Malka; Philippe Balcou; G. Grillon; Stavros D. Moustaizis; L. Notebaert; M. Pittman; Erik Lefebvre

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Resonant nuclear excitation with high-energy lasers

Author(s): G. Malka; Marie Madeleine Aleonard; J. F. Chemin; G. Claverie; M. Harston; J. N. Scheurer; V. Meot

Author(s): G. Malka; Marie Madeleine Aleonard; J. F. Chemin; G. Claverie; M. Harston; J. N. Scheurer; V. Meot

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Development of lower energy neutron spectroscopy for areal density measurement in implosion experiment at NIF and OMEGA

Author(s): Nobuhiko Izumi; Richard A. Lerche; Thomas W. Phillips; Gregory J. Schmid; Michael J. Moran; Thomas Craig Sangster

Author(s): Nobuhiko Izumi; Richard A. Lerche; Thomas W. Phillips; Gregory J. Schmid; Michael J. Moran; Thomas Craig Sangster

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S filter: a compact high dispersion in-column energy filter

Author(s): Katsushige Tsuno

Author(s): Katsushige Tsuno

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Compact neutron source development at LBNL

Author(s): Jani Reijonen; Tak Pui Lou; Bryan Tolmachoff; Ka-Ngo Leung

Author(s): Jani Reijonen; Tak Pui Lou; Bryan Tolmachoff; Ka-Ngo Leung

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Compact electron beam focusing column

Author(s): Arun Persaud; Ka-Ngo Leung; Jani Reijonen

Author(s): Arun Persaud; Ka-Ngo Leung; Jani Reijonen

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Focused ion beam methods of nanofabrication: room at the bottom

Author(s): Robert L. Gerlach; Mark Utlaut

Author(s): Robert L. Gerlach; Mark Utlaut

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Improved 3D boundary charge method for high-accuracy calculation of potential and electric field in composite dielectric system

Author(s): Hidekazu Murata; Toshimi Ohye; Hiroshi Shimoyama

Author(s): Hidekazu Murata; Toshimi Ohye; Hiroshi Shimoyama

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New features in program package POCAD

Author(s): Peter L. H. Albertino Leunissen; Michael Andrianus Johannes van der Stam; Pieter Kruit

Author(s): Peter L. H. Albertino Leunissen; Michael Andrianus Johannes van der Stam; Pieter Kruit

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Application of genetic algorithms to the optimization design of electron optical system

Author(s): Changxin Gu; M. Q. Wu; Liying Shan; G. Lin

Author(s): Changxin Gu; M. Q. Wu; Liying Shan; G. Lin

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Application of artificial neural network to an inverse design of an electron gun's main lens

Author(s): Yan Tu; Xuefei Zhong

Author(s): Yan Tu; Xuefei Zhong

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Computer simulation of electric field analysis for vertically aligned carbon nanotubes (2): electric field on the nanotube apex

Author(s): Hiroshi Shimoyama; Hidekazu Murata; Toshimi Ohye

Author(s): Hiroshi Shimoyama; Hidekazu Murata; Toshimi Ohye

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Computer simulation of electric field analysis for vertically aligned carbon nanotubes (1): simulation method and computing model

Author(s): Hidekazu Murata; Hiroshi Shimoyama; Toshimi Ohye

Author(s): Hidekazu Murata; Hiroshi Shimoyama; Toshimi Ohye

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Sensitivity analyses for construction of monochrome electron guns

Author(s): Roger Casanova Alig

Author(s): Roger Casanova Alig

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New method for simulating charging effects on specimens in electron beam testing

Author(s): Naoto Kihara; Erika Kanematsu; Yoshinobu Kimura; Hiroshi Hayashi; Noriyuki Ishihara

Author(s): Naoto Kihara; Erika Kanematsu; Yoshinobu Kimura; Hiroshi Hayashi; Noriyuki Ishihara

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Theoretical analysis of achromatic deflectors

Author(s): Igor A. Petrov; T. Y. Fishkova; L. P. Ovsyannikova

Author(s): Igor A. Petrov; T. Y. Fishkova; L. P. Ovsyannikova

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Intense ion beams accelerated by relativistic laser plasmas

Author(s): Markus Roth; Thomas E. Cowan; Jean-Claude J. Gauthier; Matthew Allen; Patrick Audebert; Abel Blazevic; Julien Fuchs; Matthias Geissel; Manuel Hegelich; S. Karsch; Jurgen Meyer-ter-Vehn; Alexander Pukhov; Theodor Schlegel

Author(s): Markus Roth; Thomas E. Cowan; Jean-Claude J. Gauthier; Matthew Allen; Patrick Audebert; Abel Blazevic; Julien Fuchs; Matthias Geissel; Manuel Hegelich; S. Karsch; Jurgen Meyer-ter-Vehn; Alexander Pukhov; Theodor Schlegel

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Electrostatic aberration correction in low-voltage SEM

Author(s): Diederik J. Maas; Sander Henstra; Marcel Krijn; Sjoerd Mentink

Author(s): Diederik J. Maas; Sander Henstra; Marcel Krijn; Sjoerd Mentink

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Aberration correction for charged particle lithography

Author(s): Eric Munro; Xieqing Zhu; John A. Rouse; Haoning Liu

Author(s): Eric Munro; Xieqing Zhu; John A. Rouse; Haoning Liu

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