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Laser Metrology for Precision Measurement and Inspection in Industry

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Volume Details

Volume Number: 4420
Date Published: 11 September 2001

Table of Contents
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Sources of error in absolute distance interferometry
Author(s): Jack A. Stone; A. Stejskal; Lowell P. Howard
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High-precision measurement of cylinder form deviations with grazing incidence interferometry
Author(s): Albert Weckenmann; Thomas Kersting; Wilfried Schimke
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Interferometric length and roughness measurements with nanometer accuracy level
Author(s): Alexandre Titov; Igor Malinovsky; H. Belaidi; R. S. Franca; C. A. Massone
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Unique criterion to estimate the performances of some laser diode range finders
Author(s): Bernard A. Journet; Gaelle Bazin; Cecile Durieu
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New sensor for triangulation measurement of AGV attitude and position
Author(s): Mariolino De Cecco
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Material testing of laser welds and claddings using digital speckle photography
Author(s): Daniel Holstein; Werner P. O. Jueptner
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Interferometric method for in-situ characterization of coating industrial processes
Author(s): Alexandre F. Michels; Flavio Horowitz
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Comparison between laser interferometric and calibrated artifacts for the geometric test of machine tools
Author(s): Andre R. Sousa; Carlos A. Schneider
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User's guide to IR detectors
Author(s): Glenn D. Boreman
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New generation of lasermike
Author(s): Ryszard Jablonski; Pawel Fotowicz
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New strategic challenges for instrumentation in precision laser metrology for industry
Author(s): Matthias Chour; Jochen Mueller; Dietrich Hofmann
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Application of endoscopic ESPI in NDI
Author(s): Erwin K. Hack
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Portable residual stresses measurement device using ESPI and a radial in-plane interferometer
Author(s): Armando Albertazzi Jr.; Cesar Kanda; Maikon R. Borges; Frank Hrebabetzky
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Comparison of strain/stress measurements on free form surfaces using ESPI and strain gauge technique
Author(s): Juliano de Lemos; Horst Konstantin Mischo; Tilo Pfeifer
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Multipulsed digital holography applied to full 3D measurements of dynamic events
Author(s): Fernando Mendoza Santoyo; Giancarlo Pedrini; Staffan Schedin; Hans J. Tiziani
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Recent developments in double-pulsed video speckle interferometry and its application to the measurement of high-speed transient deformations
Author(s): Guillermo H. Kaufmann; Pablo D. Ruiz; Gustavo E. Galizzi
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Robust spatial phase-stepping ESPI system
Author(s): Meinhard Sesselmann; Armando Albertazzi Jr.
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Camera-based active phase stabilization for electronic holography
Author(s): Frank Hrebabetzky; Armando Albertazzi Jr.; Celso L. N. Veiga
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Spatial phase-stepping using a computer-generated diffractive optical element
Author(s): Ramon Rodriguez-Vera; Bernardino Barrientos; Andrew John Moore
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Noninvasive microtomographic inspection of rough surfaces by active triangulation
Author(s): Manuel Filipe M. Costa
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Traceable measurement results from scanning probe microscopes by laser interferometry
Author(s): K. Hasche; Konrad Herrmann; R. Seemann; Hans-Joachim Buechner
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Laser-based measurement to nanometer scale accuracy
Author(s): Gerd Jaeger
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