Share Email Print
cover

PROCEEDINGS VOLUME 3636

Flat Panel Display Technology and Display Metrology

*This item is only available on the SPIE Digital Library.


Volume Details

Volume Number: 3636
Date Published: 12 April 1999

Table of Contents
show all abstracts | hide all abstracts
Polycrystalline thin-film transistors on plastic substrates
Author(s): Paul G. Carey; Patrick M. Smith; Steven D. Theiss; Paul Wickboldt; Thomas W. Sigmon
Show Abstract
Front panel engineering with CAD simulation tool
Author(s): Jacques Delacour; Serge Ungar; Gilles Mathieu; Guenther Hasna; Pascal Martinez; Jean-Christophe Roche
Show Abstract
VGA active-matrix OLED displays having the single polysilicon TFT pixel structure
Author(s): Miltiadis K. Hatalis; Mark J. Stewart; Robert S. Howell; Leo Pires; Webster E. Howard; Olivier Prache
Show Abstract
Compliant substrates for thin-film transistor backplanes
Author(s): Sigurd Wagner; Helena Gleskova; Eugene Y. Ma; Zhigang Suo
Show Abstract
High-resolution direct-view displays based on the biological photochromic material bacteriorhodopsin
Author(s): Norbert A. Hampp; Markus Sanio; Klaus Anderle
Show Abstract
Diffractive color separation filter for high-efficiency LCD panels
Author(s): Peter S. Erbach; Gregg T. Borek; David R. Brown; Thomas V. Gunn
Show Abstract
Scanner design and resolution trade-offs for miniature scanning displays
Author(s): Hakan Urey; David W. Wine; John R. Lewis
Show Abstract
Surface plasmon tunable filters and flat panel display device
Author(s): Yu Wang
Show Abstract
Thin-film EL phosphor development
Author(s): Wusheng Tong
Show Abstract
Trap states in electroluminescent SrS:Cu phosphor thin films using thermally stimulated luminescence
Author(s): David C. Morton; Eric W. Forsythe; Sey-Shing Sun
Show Abstract
Protectively coated phosphors
Author(s): Guillermo R. Villalobos; Shyam S. Bayya; Jasbinder Singh Sanghera; Ishwar D. Aggarwal
Show Abstract
Highly efficient phosphors and phospher screens for FED displays
Author(s): E. Tim Goldburt; V. A. Bolchouchine; B. N. Levonovitch; N. P. Sochtine
Show Abstract
Development of standards for characterization of cathodoluminescence efficiency
Author(s): Lauren E. Shea; Robert J. Walko
Show Abstract
Nanocrystalline phosphors for field emission displays
Author(s): Banahalli R. Ratna; A. D. Dinsmore; Y. Tian; David S.Y. Hsu; Henry F. Gray
Show Abstract
Thin CRT display design and performance
Author(s): Theodore S. Fahlen
Show Abstract
Low-voltage vertical multilayer thin-film-edge FEA for field emitter displays
Author(s): David S.Y. Hsu; Henry F. Gray
Show Abstract
Flashover performance of thin-wall spacers in field emission displays
Author(s): Xianyun Ma; Tangali S. Sudarshan
Show Abstract
Color calibration of liquid crystal displays
Author(s): Albert N. Cazes; Gordon W. Braudaway; James Christensen; Michael Cordes; Don DeCain; Shui-Chih A. Lien; Frederick C. Mintzer; Steven L. Wright
Show Abstract
NIST calibration facility for display colorimeters
Author(s): Steven W. Brown; Yoshihiro Ohno
Show Abstract
LCD visual performance: characterization and evaluation
Author(s): Michael E. Becker
Show Abstract
Simulated-eye-design camera for high-contrast measurements
Author(s): Edward F. Kelley
Show Abstract
New uniformity measurement method for LCD panels
Author(s): Thierry R. Leroux
Show Abstract
Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs
Author(s): Steven L. Wright; Steven Millman; Manabu Kodate
Show Abstract
Degradation of the reproduction of the high-order sensation caused by halation
Author(s): Hideki Shirai; Masashi Kameda; Makoto M. Miyahara; Shuji Taniho; V. Ralph Algazi
Show Abstract
Time-domain flicker measurement technique
Author(s): Joseph Miseli
Show Abstract
Stray light elimination in making projection display measurements
Author(s): Paul A. Boynton; Edward F. Kelley
Show Abstract
NIST display interface testbed: the development of a centrally controlled testing system for the automated generation of stimuli and control feedback
Author(s): John W. Roberts; James A. Ward
Show Abstract

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray