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Machine Vision Applications, Architectures, and Systems Integration VI
Editor(s): Susan Snell Solomon; Bruce G. Batchelor; John W. V. Miller

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Volume Details

Volume Number: 3205
Date Published: 18 September 1997

Table of Contents
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Advantages of computer cameras over video cameras/frame grabbers for high-speed vision applications
Author(s): Gaylord G. Olson; Jo Norvelle Walker
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Optical tooling for flexible manufacture
Author(s): David M. Berg
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Color measurements of nonhomogeneous colored flat surfaces using a PC-based color camera vision system
Author(s): Franz A. Pertl; Robert P. M. Craven; James E. Smith; Curtis Duhn
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High depth-of-field imaging without sacrificing light-gathering power and resolution
Author(s): Alan R. FitzGerrell; Edward R. Dowski Jr.
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Challenges of adapting a dual-wavelength infrared imaging system as an industrial inspection tool
Author(s): Behrouz N. Shabestari; Helen E. Kourous; Spencer D. Luster; Jaroslaw P. Sacha; Stephen Graff
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X-ray agricultural product inspection: segmentation and classification
Author(s): David P. Casasent; Ashit Talukder; Ha-Woon Lee
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Rotation invariant features for wear particle classification
Author(s): Hamzah Arof; Farzin Deravi
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Image recognition using a growing-cell-based neural network
Author(s): Jinming Yang; Majid A. Ahmadi; Graham A. Jullien; W. C. Miller
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Region segmentation based on 3D geometry from range images
Author(s): Dongming Zhao; Jenny J. Chen; Xingjun Wang; Sean X. Zhang
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Design of a flexible image processing library in C++
Author(s): Jaroslaw P. Sacha; Behrouz N. Shabestari; Timothy A. Kohler
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Three-dimensional multistage network applying for facial images decomposition
Author(s): Leonid I. Timchenko; Serge V. Chepornyuk; Maxim A. Grudin; David Mark Harvey; Yuri F. Kutaev; Alexander A. Gertsiy; Lubov V. Zahoruiko
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Implementation of SKIPSM for 3D binary morphology
Author(s): Frederick M. Waltz
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Integrated machine vision technology for line-scan applications
Author(s): Risto S. Mitikka; Markku Pietikainen; Jouko Vilmi; Heikki J. Ailisto
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Binary dilation using SKIPSM: some interesting variations
Author(s): Frederick M. Waltz
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New design environment for defect detection in web inspection systems
Author(s): S. Hossain Hajimowlana; Roberto Muscedere; Graham A. Jullien; James W. Roberts
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High-speed image processing algorithms using MMX hardware
Author(s): John W. V. Miller; James Wood
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Software implementation of 2D gray-level dilation using SKIPSM
Author(s): John W. V. Miller; Frederick M. Waltz
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Software implementation of the SKIPSM paradigm under PIP
Author(s): Ralf Hack; Frederick M. Waltz; Bruce G. Batchelor
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Color-to-speech sensory substitution device for the visually impaired
Author(s): Gabriel McMorrow; Xiaojun Wang; Paul F. Whelan
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Effects of aging on perception of motion
Author(s): Manpreet Kaur; Joseph Wilder; George Hung; Bela Julesz
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Real-time implementation of a color sorting system
Author(s): Srikathyanyani Srikanteswara; Qiang O. Lu; William King; Thomas H. Drayer; Richard W. Conners; D. Earl Kline; Philip A. Araman
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Machine vision for the control of reflecting nonplane surfaces
Author(s): Denis Aluze; Claudine Coulot; Fabrice Meriaudeau; Patrick Gorria; Christophe Dumont
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Comparative study of two different multiple-expert architectures for robust object recognition
Author(s): A. Fuad R. Rahman; Michael C. Fairhurst
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Machine vision: recent advances in CCD video camera technology
Author(s): Richard A. Easton; Ronald J. Hamilton
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Highly integrated image sensors enable low-cost imaging systems
Author(s): Paul K. Gallagher; Don Lake; David Chalmers; J. E. D. Hurwitz
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Train-by-show in color-based assembly and packaging inspection
Author(s): Robert K. McConnell
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Machine-vision-based alignment: space to factory to garage
Author(s): Donald J. Christian; Hoshang Shroff
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Diamond cutting-tool alignment with machine vision
Author(s): Stephen B. Kaiser
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Automated vision-based quality control for electro-optical module manufacturing
Author(s): Iqbal M. Dar
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Determination of bake time and temperature of painted plastic using mathematical morphology and neural networks
Author(s): Robert M. Lougheed; Michelle Mikulec; John M. Trenkle; David L. McCubbrey
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Application of online gauging for closed-loop process control
Author(s): Randall Kemmerer
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Machine vision and the World Wide Web: design and training aids
Author(s): Paul F. Whelan; Bruce G. Batchelor; Melanie R. F. Lewis; Ralf Hack
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