### PROCEEDINGS VOLUME 2265

Polarization Analysis and Measurement II*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 2265

Date Published: 14 September 1994

Date Published: 14 September 1994

Table of Contents

show all abstracts |
hide all abstracts

Standard polarization components: progress toward an optical retardance standard

Author(s): Kent B. Rochford; Paul A. Williams; Allen H. Rose; I. G. Clarke; Paul D. Hale; Gordon W. Day

Author(s): Kent B. Rochford; Paul A. Williams; Allen H. Rose; I. G. Clarke; Paul D. Hale; Gordon W. Day

Show Abstract

Principal angles and principal azimuths of an in-line symmetric three-reflection bare-mirror system: application to circular polarization of VUV radiation

Author(s): Ayman Mohammed Kan'an; Rasheed M. A. Azzam

Author(s): Ayman Mohammed Kan'an; Rasheed M. A. Azzam

Show Abstract

Polarization alignment of polarization maintaining fiber using coherent detection

Author(s): Roman C. Gutierrez

Author(s): Roman C. Gutierrez

Show Abstract

Fast imaging polarimetry with precision universal compensator

Author(s): Guang Mei; Rudolf Oldenbourg

Author(s): Guang Mei; Rudolf Oldenbourg

Show Abstract

Spatiotemporal strain distribution mapping using novel optical heterodyne polarimeter

Author(s): Kazuhiko Oka; Tomoko Yamaguchi; Yoshihiro Ohtsuka

Author(s): Kazuhiko Oka; Tomoko Yamaguchi; Yoshihiro Ohtsuka

Show Abstract

Fiber optic in-line polarimeter: system design and computer-aided analysis

Author(s): Bernhard Scholl; Jens C. Rasmussen; Hans Juergen Schmitt

Author(s): Bernhard Scholl; Jens C. Rasmussen; Hans Juergen Schmitt

Show Abstract

Polariscope using the phase-shifting technique

Author(s): Yukitoshi Otani; Toru Yoshizawa

Author(s): Yukitoshi Otani; Toru Yoshizawa

Show Abstract

Development and calibration of an optical fiber polarimeter

Author(s): Charles S. Brown; Marcus W. Shute Sr.; Diedre D. Williams; F.U. Muhammad

Author(s): Charles S. Brown; Marcus W. Shute Sr.; Diedre D. Williams; F.U. Muhammad

Show Abstract

New method for the determination of the G factor for a spectrophotofluorometer

Author(s): Edward Collett; Enrique Homar

Author(s): Edward Collett; Enrique Homar

Show Abstract

Birefringent characteristics of two new crystalline materials: CeF3 and LaF3

Author(s): Michael J. Derks; Greg A. Kopp

Author(s): Michael J. Derks; Greg A. Kopp

Show Abstract

Periodic and quasiperiodic nonquarterwave multilayer coating for 90-deg reflection phase retardance at 45-deg angle of incidence

Author(s): Mostofa M. K. Howlader; Rasheed M. A. Azzam

Author(s): Mostofa M. K. Howlader; Rasheed M. A. Azzam

Show Abstract

Fabrication of two-dimensional rough surfaces for light scattering and polarization measurements

Author(s): Michel A. Josse; Zu-Han Gu

Author(s): Michel A. Josse; Zu-Han Gu

Show Abstract

Polarimetry and scatterometry using a Wollaston polarimeter

Author(s): Conrad Wells; Samuel F. Pellicori; Mike Pavlov

Author(s): Conrad Wells; Samuel F. Pellicori; Mike Pavlov

Show Abstract

Polarizer uniformity measurements taken with an imaging polarimeter

Author(s): J. Larry Pezzaniti; Russell A. Chipman; Stephen C. McClain

Author(s): J. Larry Pezzaniti; Russell A. Chipman; Stephen C. McClain

Show Abstract

Fresnel's interface reflection coefficients for the parallel and perpendicular polarizations: global properties and facts not found in your textbook

Author(s): Rasheed M. A. Azzam

Author(s): Rasheed M. A. Azzam

Show Abstract

Complex-amplitude noise characteristics of analog liquid crystal spatial light modulators

Author(s): Michael V. Morelli; Thomas F. Krile; John F. Walkup

Author(s): Michael V. Morelli; Thomas F. Krile; John F. Walkup

Show Abstract

Ellipsometric measurements applied to liquid crystal display technology

Author(s): Leonard G. Hale; Donald B. Taber; Eric Schonning; Donato Rizzi; William J. Gunning III; John P. Eblen Jr.

Author(s): Leonard G. Hale; Donald B. Taber; Eric Schonning; Donato Rizzi; William J. Gunning III; John P. Eblen Jr.

Show Abstract

Mueller matrix formalism in imagery: an experimental arrangement for noise reduction

Author(s): Bernard Le Jeune; Jean-Pierre Marie; Pierre-Yves Gerligand; Jack Cariou; Jean Lotrian

Author(s): Bernard Le Jeune; Jean-Pierre Marie; Pierre-Yves Gerligand; Jack Cariou; Jean Lotrian

Show Abstract

Ellipsometric measurements on SiO2 by intensity ratio technique

Author(s): Yu-Faye Chao; C. S. Wei; Wei-Te Lee; Shy Chaung Lin; Tien Sheng Chao

Author(s): Yu-Faye Chao; C. S. Wei; Wei-Te Lee; Shy Chaung Lin; Tien Sheng Chao

Show Abstract

Modulated interference effects: use of photoelastic modulators with lasers

Author(s): Theodore C. Oakberg

Author(s): Theodore C. Oakberg

Show Abstract

Tunable birefringent filters using liquid crystal variable retarders

Author(s): Greg A. Kopp

Author(s): Greg A. Kopp

Show Abstract

Compensation of extraordinary ray pencil astigmatism generated by a birefringent crystal in convergent beam

Author(s): Jean-Jacques P. Arnoux

Author(s): Jean-Jacques P. Arnoux

Show Abstract

Evaluation of the spatial inhomogeneities of ferrofluid thin plates polarimetric characteristics for active imagery

Author(s): Pierre-Yves Gerligand; Bernard Le Jeune; Jack Cariou; Jean Lotrian

Author(s): Pierre-Yves Gerligand; Bernard Le Jeune; Jack Cariou; Jean Lotrian

Show Abstract

Liquid Crystal Polarimeter for solid state imaging of solar vector magnetic fields

Author(s): Laurence J. November; Lawrence M. Wilkins

Author(s): Laurence J. November; Lawrence M. Wilkins

Show Abstract

Zurich Imaging Stokes Polarimeters I and II

Author(s): Christoph U. Keller; Hans-Peter Povel; Jan Olof Stenflo

Author(s): Christoph U. Keller; Hans-Peter Povel; Jan Olof Stenflo

Show Abstract

Use of Mueller and non-Mueller matrices to describe polarization properties of telescope-based polarimeters

Author(s): P. H. Seagraves; David F. Elmore

Author(s): P. H. Seagraves; David F. Elmore

Show Abstract

Polarization sensitivity modeling of reflective imaging systems

Author(s): Conrad Wells

Author(s): Conrad Wells

Show Abstract

Optimum angles for a Mueller matrix polarimeter

Author(s): Amrit Ambirajan; Dwight C. Look Jr.

Author(s): Amrit Ambirajan; Dwight C. Look Jr.

Show Abstract

Unified formalism for polarization optics: further developments

Author(s): Charles S. Brown; F.U. Muhammad

Author(s): Charles S. Brown; F.U. Muhammad

Show Abstract

Lorentz group underpinnings for the Jones and Mueller calculi

Author(s): F.U. Muhammad; Charles S. Brown

Author(s): F.U. Muhammad; Charles S. Brown

Show Abstract

Polarization analysis of depolarizing optical systems

Author(s): Sergey S. Girgel; Victor A. Emelyanov; Nikolay N. Fedosenko

Author(s): Sergey S. Girgel; Victor A. Emelyanov; Nikolay N. Fedosenko

Show Abstract

Phase-shift control in electro-optical analyzers

Author(s): Victor M. Grigoryev; Nikolai I. Kobanov

Author(s): Victor M. Grigoryev; Nikolai I. Kobanov

Show Abstract

Light depolarization in optical waveguides with irregular boundaries of dielectric layers

Author(s): Andry V. Kovalenko; Vitalij N. Kurashov; Natalia I. Deriougina

Author(s): Andry V. Kovalenko; Vitalij N. Kurashov; Natalia I. Deriougina

Show Abstract

Polarization-based devices in solar observations at the Sayan Observatory

Author(s): Victor M. Grigoryev; Nikolai I. Kobanov; Valery I. Skomorovsky

Author(s): Victor M. Grigoryev; Nikolai I. Kobanov; Valery I. Skomorovsky

Show Abstract

Parametric resonance in optical resonator systems with anisotropic modulators

Author(s): Alexander M. Kul'minskii; Valerii N. Severikov; Alexander P. Voitovich

Author(s): Alexander M. Kul'minskii; Valerii N. Severikov; Alexander P. Voitovich

Show Abstract

One method of imaging polarimetry for remote sensing purposes: the technique accuracy investigations

Author(s): Oleh Lychak

Author(s): Oleh Lychak

Show Abstract

Anisotropically saturating nonlinearity of the polymer films with bacteriorhodopsin

Author(s): Elena Y. Korchemskaya; Marat S. Soskin; Dmitriy A. Stepanchikov

Author(s): Elena Y. Korchemskaya; Marat S. Soskin; Dmitriy A. Stepanchikov

Show Abstract

Advance of the design and technology of birefringent filters

Author(s): Valery I. Skomorovsky

Author(s): Valery I. Skomorovsky

Show Abstract

Chromatic dispersion characteristics of highly birefringent optical fibers

Author(s): Velko Peyov Tzolov; Marie Fontaine

Author(s): Velko Peyov Tzolov; Marie Fontaine

Show Abstract

Investigation of stress-induced birefringence in large semiconductor wafers by imaging polarimetry

Author(s): Andrzej L. Bajor

Author(s): Andrzej L. Bajor

Show Abstract

Instrumental polarization effects of the German Vacuum Tower Telescope (VTT) at Tenerife

Author(s): Dirk Soltau

Author(s): Dirk Soltau

Show Abstract

Ultraviolet/visible polarimetric signatures for discrimination

Author(s): Stephen L. Hammonds; Dimitris Lianos

Author(s): Stephen L. Hammonds; Dimitris Lianos

Show Abstract

Polarization errors associated with birefringent waveplates

Author(s): Edward A. West; Matthew H. Smith

Author(s): Edward A. West; Matthew H. Smith

Show Abstract

**© SPIE.**Terms of Use