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Charged-Particle Optics
Editor(s): William B. Thompson; Mitsugu Sato; Albert V. Crewe

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Volume Details

Volume Number: 2014
Date Published: 3 September 1993

Table of Contents
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Computational modeling techniques in charged-particle optics
Author(s): Eric Munro
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Snorkel-type conical objective lens with E cross B field for detecting secondary electrons
Author(s): Mitsugu Sato; Hideo Todokoro; Kaneo Kageyama
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New developments in personal computer software for accelerator simulation and analysis
Author(s): George H. Gillespie; John L. Orthel
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Computer simulation of electron optical characteristics of accelerating tube for high-voltage electron microscope
Author(s): Toshimi Ohye; Chiaki Morita; Hiroshi Shimoyama
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Design of a multimode transport lens with optimization program SOEM
Author(s): Michael Andrianus Johannes van der Stam; Jim Edmond Barth; Pieter Kruit
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Surface-charge method and electron ray tracing on vector pipeline supercomputers
Author(s): Ryo Iiyoshi; Hiroyuki Niwa; Hideo Takematsu
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High-throughput projection electron-beam lithography employing SCALPEL
Author(s): James Alexander Liddle; Steven D. Berger
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Aberration problem in electron optics
Author(s): Albert V. Crewe
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Design of an achromatic mass separator for a focused-ion-beam system
Author(s): Jochen Teichert; Michail A. Tiunov
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Compact, precision electrostatic quadrupole lens system for high-brightness ion-beam transport and focusing
Author(s): Samar Kumar Guharay; C. K. Allen; Martin P. Reiser
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Computer simulation of energetic Boersch effect in the diode region of the field emission gun
Author(s): Hiroshi Shimoyama; Yasuhisa Shimazaki; Akiro Tanaka
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Simulation and interpretation of scanning electron microscope images
Author(s): Maya Balasubramanyam; Eric Munro; Jim Taylor
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Using optimum magnification as a figure of merit to evaluate the performance of focused-ion-beam columns
Author(s): Raymond Hill
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Interpolation method for ray tracing in electrostatic fields calculated by the finite element method
Author(s): Jaroslav Chmelik; Jim Edmond Barth
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Computer-aided design of photomultiplier tubes using a 3D program
Author(s): Khadija Tahir; John A. Rouse; Eric Munro
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SIMS input lens
Author(s): Robert L. Gerlach; Michael R. Scheinfein; Geoffrey A. Crow; Mark Utlaut; Charles Bickford
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Higher-order aberrations in sector field and quadrupole systems
Author(s): Hermann Wollnik
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New evaluation method for the depth of field in terms of the information-passing capacity
Author(s): Mitsugu Sato; Hideo Todokoro; Mine Nakagawa
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