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Machine Vision Applications in Character Recognition and Industrial Inspection
Editor(s): Donald P. D'Amato; Wolf-Ekkehard Blanz; Byron E. Dom; Sargur N. Srihari

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Volume Details

Volume Number: 1661
Date Published: 1 August 1992

Table of Contents
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Characteristics of digitized images of technical articles
Author(s): Mahesh Viswanathan; George Nagy
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Using morphology and associative memories to associate salt-and-pepper noise with OCR error rates in document images
Author(s): Vicente P. Concepcion; Matthew P. Grzech
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Contrast enhancement of mail piece images
Author(s): Yong-Chul Shin; Ramalingam Sridhar; Victor Demjanenko; Paul W. Palumbo; Jonathan J. Hull
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Extraction of text boxes from engineering drawings
Author(s): Ian Chai; Dov Dori
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Document understanding using layout styles of title page images
Author(s): Louis H. Sharpe II; Basil Manns
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Segmenting handwritten text lines into words using distance algorithms
Author(s): Giovanni Seni; Edward Cohen
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Evaluation system for handwritten characters
Author(s): Takahito Kato
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Recognition of characteristic symbols in engineering drawings
Author(s): Chan Pyng Lai; Rangachar Kasturi
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Estimation of linear stroke parameters using iterative total least squares methods
Author(s): Jan A. Van Mieghem; Hadar I. Avi-Itzhak; Roger D. Melen
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Gray-scale character recognition using boundary features
Author(s): Stephen W. Lam; Anthony C. Girardin; Sargur N. Srihari
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Morphological approach to machine-printed character recognition: a feasibility study
Author(s): Radovan V. Krtolica; Brian Warner
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Recognition of poorly printed text by direct extraction of features from gray scale
Author(s): Theo Pavlidis; Li Wang; Jiangying Zhou; William J. Sakoda; Jairo Rocha
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Noisy Hangul character recognition with fuzzy tree classifier
Author(s): Seong-Whan Lee
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Regression approach to combination of decisions by multiple character recognition algorithms
Author(s): Tin Kam Ho; Jonathan J. Hull; Sargur N. Srihari
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Use of a priori knowledge for character recognition
Author(s): Gilles Houle; Kie Bum Eom
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Character recognition: a unified approach
Author(s): Nassrin Tavakoli
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One view of the methodology in handwriting character recognition
Author(s): Leon A. Pintsov
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Training feed-forward neural networks using conjugate gradients
Author(s): James L. Blue; Patrick J. Grother
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Comparison of neural network classifiers for optical character recognition
Author(s): Thomas E. Baker; Hal McCartor
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Automated optical recognition of degraded handwritten characters
Author(s): Emade Darwiche; Abhijit S. Pandya; Anil D. Mandalia
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Syntactic neural network for character recognition
Author(s): Viktor A. Jaravine
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Offline recognition of handwritten cursive words
Author(s): John T. Favata; Sargur N. Srihari
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System for line drawings interpretation
Author(s): L. Boatto; Vincenzo Consorti; Monica Del Buono; Vincenzo Eramo; Alessandra Esposito; F. Melcarne; Mario Meucci; M. Mosciatti; M. Tucci; Arturo Morelli
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Model-based control strategy for document image analysis
Author(s): Frank Fein; Frank Hoenes
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Contextual analysis of machine-printed addresses
Author(s): Peter B. Cullen; Tin Kam Ho; Jonathan J. Hull; Michal Prussak; Sargur N. Srihari
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Massively parallel implementation of character recognition systems
Author(s): Michael D. Garris; Charles L. Wilson; James L. Blue; Gerald T. Candela; Patrick J. Grother; Stanley A. Janet; R. Allen Wilkinson
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Neural network approach to text processing
Author(s): S. Sunthankar
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Recent advances in inspecting integrated circuits for pattern defects
Author(s): Virginia H. Brecher; Byron E. Dom
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Minimization of false defect reporting in a patterned silicon wafer inspection system
Author(s): John R. Dralla; John C. Hoff
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Wafer examination and critical dimension estimation using scattered light
Author(s): Richard H. Krukar; Susan M. Gaspar; Scott R. Wilson; Donald R. Hush; S. Sohail H. Naqvi; John Robert McNeil
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Wafer pattern inspection using a Coherent Optical Processor
Author(s): Xian-Yang Cai; Frank Kvasnik
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Efficient Fourier image analysis algorithm for aligned rectangular and trapezoidal wafer structures
Author(s): Chiao-Fe Shu; Ramesh C. Jain
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Calibration, setup, and performance evaluation in an IC inspection system
Author(s): Byron E. Dom; Virginia H. Brecher
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Three-dimensional inspection of integrated circuits: a depth from focus approach
Author(s): Xavier Binefa; Jordi M. Vitria; Juan Jose Villanueva
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CCD photoresponse calibration and contrast adjustment for reliable material discrimination in the inspection of electronic packages
Author(s): Ralph M. Ford; Pieter J. M. Kerstens; Alan D. Dorundo
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Alignment mark detection using signed-contrast gradient edge maps
Author(s): John Raymond Jordan III
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Advanced Via Inspection Tool
Author(s): Douglas Y. Kim; Kurt Muller; Lawrence D. Thorp; Kenneth A. Bird
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Automated vision system for inspection of wedge bonds
Author(s): Koduri K. Sreenivasan; Mandayam D. Srinath; Alireza R. Khotanzad
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