Share Email Print


Optical Scatter: Applications, Measurement, and Theory
Editor(s): John C. Stover

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 1530
Date Published: 1 December 1991

Table of Contents
show all abstracts | hide all abstracts
Optical scatter: an overview
Author(s): John C. Stover
Show Abstract
Stokes vectors, Mueller matrices, and polarized scattered light: experimental applications to optical surfaces and all other scatterers
Author(s): William S. Bickel; Gorden W. Videen
Show Abstract
Sinusoidal surfaces as standards for BRDF instruments
Author(s): Egon Marx; Thomas Robert Lettieri; Theodore V. Vorburger; Malcolm B. McIntosh
Show Abstract
Stray-light implications of scratch/dig specifications
Author(s): Isabella T. Lewis; Arno G. Ledebuhr; Marvin L. Bernt
Show Abstract
Scattering from multilayer coatings: a linear systems model
Author(s): James E. Harvey; Kristin L. Lewotsky
Show Abstract
Infrared window damage measured by reflective scatter
Author(s): Marvin L. Bernt; John C. Stover
Show Abstract
Backscattering image resolution as a function of particle density
Author(s): Paul L. Rochon; Daniel Bissonnette
Show Abstract
Coherence in single and multiple scattering of light from randomly rough surfaces
Author(s): Zu-Han Gu; Alexei A. Maradudin; Eugenio R. Mendez
Show Abstract
Optimal estimation of finish parameters
Author(s): Eugene L. Church; Peter Z. Takacs
Show Abstract
Comparison of low-scatter-mirror PSD derived from multiple-wavelength BRDFs and WYKO profilometer data
Author(s): Wallace K. Wong; Dexter Wang; Robert T. Benoit; Peter Barthol
Show Abstract
Scatter and roughness measurements on optical surfaces exposed to space
Author(s): Dirk-Roger Schmitt; Helmut Swoboda; Helmut Rosteck
Show Abstract
Surface roughness measurements of spherical components
Author(s): Yi-Sheng Chen; Wen-Gui Wang
Show Abstract
Frequency spectrum analysis and assessment of optical surface flaws
Author(s): Wenliang Gao; Xiao Zhang; GuoGuang Yang
Show Abstract
Solution for anomalous scattering of bare HIP Be and CVD SiC mirrors
Author(s): Cynthia L. Vernold
Show Abstract
Effective surface PSD for bare hot-isostatic-pressed beryllium mirrors
Author(s): Cynthia L. Vernold; James E. Harvey
Show Abstract
Cryoscatter measurements of beryllium
Author(s): Barret Lippey; Wilfried Krone-Schmidt
Show Abstract
Material characterization of beryllium mirrors exhibiting anomalous scatter
Author(s): Charles M. Egert
Show Abstract
Scattering from slightly rough crystal surfaces
Author(s): Eugene L. Church
Show Abstract
Study of anomalous scatter characteristics
Author(s): John C. Stover; Marvin L. Bernt; Timothy D. Henning
Show Abstract
Anomalous scattering from optical surfaces with roughness and permittivity perturbations
Author(s): J. Merle Elson
Show Abstract
Characterization of hot-isostatic-pressed optical-quality beryllium
Author(s): Jerry L. Behlau; Mark Baumler
Show Abstract
Beryllium scatter analysis program
Author(s): Jerry L. Behlau; Edward M. Granger; John J. Hannon; Mark Baumler; James F. Reilly
Show Abstract
Mapping of imbedded contaminants in transparent material by optical scatter
Author(s): Donald A. Rudberg; John C. Stover; Douglas E. McGary
Show Abstract
Experimental study of the laser retroreflection of various surfaces
Author(s): Wen Qing Liu; Rong-Xi Jiang; Ya-Ping Wang; Yu-Xing Xia
Show Abstract
Design considerations for multipurpose bidirectional reflectometers
Author(s): John Ternay Neu; Martin Bressler
Show Abstract
Helium neon laser optics: scattered light measurements and process control
Author(s): Bruce E. Perilloux
Show Abstract
Bidirectional reflectance distribution function raster scan technique for curved samples
Author(s): Malcolm B. McIntosh; Joseph R. McNeely
Show Abstract
Description and calibration of a fully automated infrared scatterometer
Author(s): Stephane Mainguy; Michel Olivier; Michel A. Josse; Michel Guidon
Show Abstract
Scatter and contamination of a low-scatter mirror
Author(s): Joseph R. McNeely; Malcolm B. McIntosh; M. Alfred Akerman
Show Abstract
Light scatter variations with respect to wafer orientation in GaAs
Author(s): Jeff L. Brown
Show Abstract
Stray-light reduction in a WFOV star tracker lens
Author(s): Isabella T. Lewis; Arno G. Ledebuhr; Timothy S. Axelrod; Scott A. Ruddell
Show Abstract
Scattering in paper coatings
Author(s): Timo S. Hyvarinen; Juha Sumen
Show Abstract
Infrared BRDF measurements of space shuttle tiles
Author(s): Raymond P. Young Sr.; Bob E. Wood; P. L. Stewart
Show Abstract
Scattering contribution to the error budget of an emissive IR calibration sphere
Author(s): John Chalupa; W. K. Cobb; Thomas L. Murdock
Show Abstract
Light scattering properties of new materials for glazing applications
Author(s): Mikael Bergkvist; Arne Roos
Show Abstract
SERS used to study the effect of Langmuir-Blodgett spacer layers on metal surface
Author(s): Bing Kun Yu; Yu Li; Yingting Wang
Show Abstract
Determination of thin-film roughness and volume structure parameters from light-scattering investigations
Author(s): Angela Duparre; Samer Kassam
Show Abstract

© SPIE. Terms of Use
Back to Top