Share Email Print


High-Speed Inspection Architectures, Barcoding, and Character Recognition
Editor(s): Michael J. W. Chen

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 1384
Date Published: 1 February 1991

Table of Contents
show all abstracts | hide all abstracts
Image registration for automated inspection of 2-D electronic circuit patterns
Author(s): Arturo A. Rodriguez; Jon R. Mandeville
Show Abstract
Automated visual inspection system for IC bonding wires using morphological processing
Author(s): Hiroyuki Tsukahara; Masato Nakashima; Takehisa Sugawara
Show Abstract
Automatic inspection system for full-color printed matter
Author(s): Shin-Ichi Meguro; Masakatu Nunotani; Katsuyuki Tanimizu; Mutsuo Sano; Akira Ishii
Show Abstract
Real-time classification of wooden boards
Author(s): Wolfgang Poelzleitner; Gert Schwingskakl
Show Abstract
Inspection of a class of industrial objects using a dense range map and CAD model
Author(s): Heikki J. Ailisto; Jussi Paakkari; Ilkka Moring
Show Abstract
New scheme for real-time visual inspection of bearing roller
Author(s): Yu Zhang; Wu Xian; Ping Li; Ernest L. Hall; James Zhen Tu
Show Abstract
Parsing algorithm for line-drawing pattern recognition
Author(s): Patrick S. P. Wang; Y. Y. Zhang
Show Abstract
Holographic labeling for automated identification
Author(s): Peter William McOwan; Andrew K. Powell; Ronald E. Burge
Show Abstract
Two-dimensional boundary inspection using autoregressive model
Author(s): M. Arif Wani; Bruce G. Batchelor
Show Abstract
Weighted least-squared error method for object localization
Author(s): Hsiang-Lung Wu
Show Abstract
Image-processing system based on algorithmically dedicated functional units
Author(s): Clesio Luis Tozzi; Jose Eduardo C. Castanho; Henrique S. Gutierrez da Costa
Show Abstract
New search method based on hash table and heuristic search method
Author(s): He-Chen Wang; Wu Xian; Da Li Luo; Xiang Song
Show Abstract
Optical properties of barcode symbols for laser scanning
Author(s): Anna Marie Quinn; Jay M. Eastman
Show Abstract
Analysis of one-dimensional barcode
Author(s): Ynjiun P. Wang; Theo Pavlidis; Jerome Swartz
Show Abstract
Thin family: a new barcode concept
Author(s): David C. Allais
Show Abstract
High-density two-dimensional barcode
Author(s): Ynjiun P. Wang; Theo Pavlidis; Jerome Swartz
Show Abstract
Comparing laser printing and barcode scanning designs
Author(s): Thomas D. MacArthur
Show Abstract
Diffraction analysis of beams for barcode scanning
Author(s): Jay M. Eastman; Anna Marie Quinn
Show Abstract
Analysis of barcode digitization techniques
Author(s): John A. Boles; Randall K. Hems
Show Abstract
Packet-switching algorithm for SIMD computers and its application to parallel computer vision
Author(s): Massimo Maresca
Show Abstract
Architecture for a multiprocessing system based on data flow processing elements in a MAXbus system
Author(s): Bennie J. Bulsink; Frits H. Klok
Show Abstract
Data-driven parallel architecture for syntactic pattern recognition
Author(s): Chien-Chao Tseng; Shu-Yuen Hwang
Show Abstract
Neural net selection of features for defect inspection
Author(s): Kenji Sasaki; David P. Casasent; Sanjay S. Natarajan
Show Abstract
Context specification for text recognition in forms
Author(s): Kelly L. Anderson; William A. Barrett
Show Abstract
New decision tree algorithm for handwritten numerals recognition using topological features
Author(s): Sebastiano Impedovo; Giovanni Dimauro; Giuseppe Pirlo
Show Abstract
Table recognition for automated document entry system
Author(s): Haruhiko Kojima; Teruo Akiyama
Show Abstract
Slope histogram detection of forged handwritten signatures
Author(s): Timothy S. Wilkinson; Joseph W. Goodman
Show Abstract
Effectiveness of certain features for optical character recognition
Author(s): Emoke Kovacs; Istvan Marosi
Show Abstract
Intelligent word-based text recognition
Author(s): Frank Hoenes; Rainer Bleisinger; Andreas R. Dengel
Show Abstract
Japanese document recognition and retrieval system using programmable SIMD processor
Author(s): Sueharu Miyahara; Akira Suzuki; Shunkichi Tada; Takahiko Kawatani
Show Abstract
Initial key word OCR filter results
Author(s): David P. Casasent; Anand K. Iyer; Gopalan Ravichandran
Show Abstract
Optical correlation filters to locate destination address blocks in OCR
Author(s): David P. Casasent; Gopalan Ravichandran
Show Abstract
Spectral signature analysis for industrial inspection
Author(s): Robert Frank Rauchmiller Jr.; Raymond S. Vanderbok
Show Abstract
Issues in parallelism in object recognition
Author(s): Suchendra M. Bhandarkar; Minsoo Suk
Show Abstract
Recognition of partially occluded objects using B-spline representation
Author(s): Ezzatollah Salari; Sridhar Balaji
Show Abstract
Adaptive imager: a real-time locally adaptive edge enhancement system
Author(s): Steven E. Strang
Show Abstract

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?