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PROCEEDINGS VOLUME 11102 • new

Applied Optical Metrology III
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Volume Details

Volume Number: 11102
Estimated Publication Date: 12 September 2019

Table of Contents
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Front Matter: Volume 11102
Author(s): Proceedings of SPIE
Optical metrology in times of digital transition (Conference Presentation)
Author(s): Wolfgang Osten; Yuhong Bai
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Electromagnetic analysis of three-dimensional shape measurement method based on speckle interferometry for fine structure by detecting phase distribution
Author(s): Y. Arai
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Recent development in BTDF/BRDF metrology on large-scale Lambertian-like diffusers: application to on-board calibration units in space instrumentation
Author(s): E. Mazy; C. Michel; S. Marcotte; L. Clermont; B. Marquet; J. Jacobs; I. Domken; Y. Stockman
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High-accuracy surface measurement through modelling of the surface transfer function in interference microscopy
Author(s): Rong Su; Matthew Thomas; Mingyu Liu; Jeremy Coupland; Richard Leach
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A proposal to eliminate the skew ray error in corneal topography using Placido disks images
Author(s): Daniel Gomez-Tejada; Daniel Malacara Hernández
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Robust and objective automatic optical surface inspection using modulated dark field phasing illumination
Author(s): Heejoo Choi; John Kam; Joel D. Berkson; Logan R. Graves; Huang Lei; Dae Wook Kim
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High-speed 3D imaging with three binary patterns using Hilbert transform
Author(s): Jae-Sang Hyun; Song Zhang
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A novel aspherical surface measurement system based on a randomly encoded hybrid grating wavefront sensor
Author(s): Rui Zhang; Yongying Yang; Zijian Liang
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Precise microscopic profilometry using diffractive image correlation and theoretical model simulation
Author(s): Guo-Wei Wu; Ming-Jun Jiang; Liang-Chia Chen
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Decomposition of non-rotationally symmetric wavefront aberrations into their azimuthal orders
Author(s): Stephan Reichelt
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Hartmann vs reverse Hartmann test: a Fourier optics point of view
Author(s): François Hénault; Cyril Pannetier
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Air Force Research Laboratory Aero-Effects Laboratory system status and capabilities
Author(s): Christopher C. Wilcox; Keith P. Healy; Andrea L. Tuffli; Brian D. Agena; Cameron Radosevich
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Analysis of shock waves in a supersonic wind tunnel at the AFRL Aero-Effects Laboratory
Author(s): Samuel P. Bingham; Cameron Radosevich; Keith Healy; Brian Agena; Andrea Tuffli; Christopher Wilcox
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Image degradation due to various aero-optical environments
Author(s): Matthew Kalensky; Jonathon Wells; Eric J. Jumper; Stanislav Gordeyev
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Does interferometry work? A critical look at the foundations of interferometric surface topography measurement
Author(s): Peter de Groot; Xavier Colonna de Lega; Rong Su; Richard Leach
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3D morphology of melanoma cells using digital holographic interferometry
Author(s): Natalith Palacios-Ortega; Fernando Mendoza Santoyo; J. Mauricio Flores Moreno; María del Socorro Hernández-Montes; Manuel H. De la Torre Ibarra; Germán Plascencia
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Comparison of interferometer and d’nanoimager for profiling large objects (Conference Presentation)
Author(s): Dingfu Chen; Yingjie Yu; Jianfei Sun; Prathan Buranasiri; Sutha Sutthiruangwong; Thanthanat Srisuwan; Anand Asundi
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Long-term stability of the wavelength method of height scale calibration for interference microscopy
Author(s): Danette Fitzgerald; Peter de Groot
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Frequency sweeping interferometry for robust and reliable distance measurements in harsh accelerator environment
Author(s): M. Sosin; H. Mainaud-Durand; V. Rude; J. Rutkowski
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Linear algebra approach to phase shifting interferometry: numerical methods
Author(s): Marco A. Escobar; Julio C. Estrada; Javier Vargas
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Random dynamic interferometer: cavity amplified speckle spectroscopy using a highly symmetric coherent field created inside a closed Lambertian optical cavity
Author(s): Guillaume Graciani; Francois Amblard
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A new method for solving the height problem in deflectometry
Author(s): Hanning Liang; Alexander Zimmermann; Reiner Kickingereder; Christian Faber
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Phase measurement deviations in deflectometry due to properties of technical surfaces
Author(s): Shekhar Kumar Patra; Jonas Bartsch; Michael Kalms; Ralf B. Bergmann
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Schlieren unwrapped: distortion correction in digital focusing schlieren
Author(s): Benjamin D. Buckner; Drew L'Esperance
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Precise positioning in the in-situ deflectometric measurement of optical surfaces
Author(s): Xiangchao Zhang; Xueyang Xu; Zhenqi Niu; Shaoliang Li; Siping Peng
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Point spread function measurement for projector based on Fourier single-pixel imaging
Author(s): Ruotong Wu; Hongzhi Jiang; Huijie Zhao; Xudong Li; Qi Guo
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Toward international standards on evaluation of holograms
Author(s): Hiroshi Yoshikawa
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Photometric evaluation of holograms
Author(s): M. Melissa Crenshaw
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Quality requirements for fine art synthetic holograms
Author(s): Jacques Desbiens
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Evaluation of the spatial frequency response and the uncertainty for a commercial structured light system
Author(s): Swati Jain; Angela Davies Allen; Bin Zhang
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Correction for aberration introduced by the curvature of the reflective spatial light modulator
Author(s): A. He; C. Quan
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Detection and classification of glass defects based on machine vision
Author(s): Jiabin Jiang; Xiang Xiao; Guohua Feng; ZiChen Lu; Yongying Yang
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Close-range image stitching based on depth information and moving DLT
Author(s): Mowen Xue; Xudong Li; Hongzhi Jiang; Huijie Zhao
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3D shop floor characterization of radii and chamfers
Author(s): Erik Novak; Kramer Lindell; Jared Wheeler
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Stochastic resonance and speed enhancement of thermoreflectance imaging for photonic device applications
Author(s): EliseAnne Koskelo; Kyle Allison; Mark Hallman; Johanna Hardin; Ami Radunskaya; Janice Hudgings
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Light fields: from shape recovery to sparse reconstruction (Conference Presentation)
Author(s): Ravi Ramamoorthi
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Scalar-field reconstruction algorithms using plenoptic cameras
Author(s): Chris Clifford; Brian Thurow
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Volumetric spectral imaging and two-color pyrometry of flames using plenoptic cameras
Author(s): Jacob George; Christopher Clifford; Thomas Jenkins; Brian Thurow
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In-situ monitoring and quality control for in-space additive manufacturing using laser acoustical resonance spectroscopy
Author(s): James D. Trolinger; Andrei K. Dioumaev; Amit K. Lal; Lorenzo Valdevit; Yunfei Zhang
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Static Fourier transform mid-infrared spectrometer with continuous background correction
Author(s): Michael H. Köhler; Michael Schardt; Hamza B. Ghazala; Ennio Colicchia; Patrick Kienle; Xingchen Dong; Kun Wang; Alexander W. Koch
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Combining multispectral and hyperspectral imaging techniques to monitor and manage wax apple orchard (Conference Presentation)
Author(s): Yi-Chun Chen; Bo-Yan Lai; Ku-Yu Chen; Chi Cho Huang; Yung-Jhe Yan; Shiou-Gwo Lin; Tzung-Cheng Chen; Mang Ou-Yang
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3D thickness measurement using pulse-driven optical coherence tomography based on wavelet transform
Author(s): Takamasa Suzuki; Bin Liu; Samuel Choi
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Using wrapped phases for light-field three-dimensional imaging
Author(s): Jiawei Chen; Zewei Cai; Xiaoli Liu; Giancarlo Pedrini; Wolfgang Osten; Xiang Peng
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Phase-shifting by polarizer rotations in a common-path cube beam-splitter interferometer
Author(s): U. Rivera-Ortega; D. Lopez-Mago
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Multiple absolute distances-based 3D coordinate measurement system for mobile machines
Author(s): S. Kim; J. Oh; S.-H. Han; Q.-K. Nguyen; S.-K. Ro; S.-W. Kim; W. Kim
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Detection and discrimination of particles on and below smooth surfaces by laser scattering with polarization measurement
Author(s): Fan Wu; Yubin Du; Pengfei Zhang; Yanwei Li; Yongying Yang
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Absolute distance measurement system for precise 3D positioning
Author(s): Seongheum Han; Seungman Kim; Jeong-Seok Oh; Seung-Kook Ro; Seung-Woo Kim
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Mechanical deformations in a graphene-reinforced cellulose sample
Author(s): A. D. Domínguez; J. A. Rayas; A. Martínez
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Real-time digital demodulation algorithm for an interferometric magnetic field sensor
Author(s): Chris Prasai; Lauren Getz; Ben Krause; Tristan J. Tayag
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Investigation and mapping strategy on influence of surface tilting in diffractive pattern correlation profilometry
Author(s): Guo-Wei Wu; Ming-Jun Jiang; Liang-Chia Chen
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Measurement of patterned surfaces with non-fluorescent structured illumination microscope
Author(s): S. Usuki; G. Shibata; Kenjiro T. Miura
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Nano-antennas excitation with visible light and their response as observed with a confocal microscope
Author(s): Daniel Luis; Fernando Mendoza Santoyo; Jorge Mauricio Flores Moreno; Francisco Javier González Contreras; Javier Méndez-Lozoya
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