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Reflection, Scattering, and Diffraction from Surfaces VI
Editor(s): Leonard M. Hanssen
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Volume Details

Volume Number: 10750
Date Published: 16 October 2018

Table of Contents
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Front Matter: Volume 10750
Author(s): Proceedings of SPIE
Laser scattering from arbitrarily shaped large objects with randomly rough surfaces
Author(s): Gerard Berginc
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Modeling of remotely sensed signatures of spacecraft
Author(s): Paul LeVan; Jennifer Leute; Martha Navarro
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Spectral signatures of solids and liquids on different substrates: the need for accurate optical constants
Author(s): Tanya L. Myers; Russell G. Tonkyn; Brent DeVetter; Tyler O. Danby; Nicole K. Scharko; Ashley M. Oeck; John S. Loring; Yin-Fong Su; Timothy J. Johnson
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Improved-anomalous diffraction approximation for accurate extinction, scatter, and absorption efficiency calculations
Author(s): M. E. Thomas
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Polarimetric evaluation of oblique and grazing angle microfacet BRDF model modification using experimental data (Conference Presentation)
Author(s): Ann Lanari; Samuel Butler; Michael A. Marciniak; Becca Ewing
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Reflectance from solids and solid particles: the need for the optical constants n and k and far-IR measurement challenges
Author(s): Brent M. DeVetter; Tanya L. Myers; Bret D. Cannon; Nicole K. Scharko; Russell G. Tonkyn; Timothy J. Johnson
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A high dynamic range imaging method for the characterization of periodic errors in diffraction gratings
Author(s): Sofia C. Corzo-Garcia; Muhammad Imran Afzal; Benjamin T. Kidder; Michelle A. Grigas; Ulf Griesmann
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Investigation of transverse motion of concealed scatterer using correlation of speckled speckles from static surface layer
Author(s): Gokul G. Nair; Vinu R.V.; Dinesh N. Naik; Michael Linde Jakobsen; Steen G. Hanson; Rakesh Kumar Singh
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The light behavior from Shallow Trench Isolation profiles at Chemical Mechanical Planarization step and correlation with optical endpoint system by interferometry
Author(s): S. Bourzgui; G. Georges; A. Roussy; J. Blue; E. Faivre; J. Pinaton
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Polarized reflectivity for quantitative crystallography of alpha-Titanium
Author(s): Brian G. Hoover; Jonathan H. Turner; Brian J. Ritter; Joseph R. Michael; Michael D. Uchic
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Stray light test results of Operational Landsat Imager 2 (OLI-2) compared to OLI
Author(s): Frank Grochocki; John Fleming; Thomas Kampe
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Nondestructive characterization of aged paper using spectral and directional reflection measurements
Author(s): M. E. Thomas; J. Ma; M. B. Airola; P. McGuiggan
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Design and characterization of a new absolute diffuse reflectance reference instrument at the NRC
Author(s): Luke J. Sandilands; Eric Côté; Joanne C. Zwinkels
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Correction of the calibration measurement by taking into account the Spectralon spectro-polarimetric BRDF model
Author(s): Martin P. Levesque; Maria Dissanska
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Metric for comparison of generic camera calibration
Author(s): Martin H. U. Prinzler; Jonas Bartsch; Michael Kalms; Ralf B. Bergmann
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Luminescence of Ho-doped lithium niobate crystals highlighted by Raman spectroscopy
Author(s): N. Kokanyan; E. Kokanyan; N. Babajanyan; T. Kauffmann; M. D. Fontana
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Evaluate thin film surface roughness accurately by a simple x-ray reflectivity distribution method and first-order perturbation theory
Author(s): Yanli Meng; Mi Lu
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Intellectualized Mueller-Jones matrix system of laser polarimetry for breast fibroadenoma diagnosis
Author(s): Kostiantyn O. Radchenko
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Processing and analysis of images in the multifunctional classification laser polarimetry system of biological objects
Author(s): Natalia I. Zabolotna; Sergei V. Pavlov; Oleksandr V. Karas; Vladyslava V. Sholota
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Control of spatial-frequency spectrum of optical radiation by liquid crystals-polymer composites
Author(s): P. P. Maksimyak; A. P. Maksimyak; A. L. Nehrych
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Investigation of the erythrocyte elasticity in the flow by the temporal chaotization of scattered light
Author(s): M. S. Gavrylyak; P. P. Maksimyak
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Spectral investigation of polarization properties of optical field scattered by muscle tissue
Author(s): M. S. Gavryliak; D. I. Prodan; O. V. Dubolazov; D. S. Gavryliak
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Using coherent optical frequency domain reflectometry to assist the additive manufacturing process of structures for radio frequency applications
Author(s): Max Koeppel; Maximilian Deckelmann; Mark Sippel; Konstantin Lomakin; Stefan Werzinger; Gerald Gold; Klaus Helmreich; Bernhard Schmauss
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Singular features of the diffraction field
Author(s): J. Munoz-Lopez; G. Martinez-Niconoff; P. Martinez-Vara
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