Share Email Print


Precision Instrument Design
Editor(s): Thomas C. Bristow; Alson E. Hatheway

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 1036
Date Published: 1 May 1989

Table of Contents
show all abstracts | hide all abstracts
Imaging Michelson Spectrometer For Hubble Space Telescope
Author(s): Arthur H. Vaughan
Show Abstract
Automated Single Mode Fiber Alignment System
Author(s): Monica Kaas
Show Abstract
Precision Lens Mounting Monitored By Interfering Beams
Author(s): Philip Lam
Show Abstract
Instrument Design Case Study Flexure Thermal Sensitivity And Wafer Stepper Baseline Drift
Author(s): Stanley W. Stone
Show Abstract
Critical Issues In The Design Of Inspection Systems For Clean Surfaces
Author(s): David M. Berg; Joachim Bunkenburg; Charles J. Cushing
Show Abstract
Spectrometer Design For A Portable Wear Metal Analyzer
Author(s): Robert E. Haring; William Niu
Show Abstract
Hologram Interferometer To Calibrate And Measure The Straightness In Micropositioning Equipment
Author(s): Martin Celaya; Ignacio Rizo; Efren Mercado
Show Abstract
A Laser Interferometer Based Accelerometer Calibrator
Author(s): Bradley N. Damazo; Alexander H. Slocum
Show Abstract
Design Of The Keck Observatory Alignment Camera
Author(s): Gary A. Chanan
Show Abstract
A Design Technique For Better Force Measurement Gauge
Author(s): Arthur L. Reenstra; Chee K. Fong
Show Abstract
Kinematic Transmission Design For The Atomic Resolution Measuring Machine (ARMM)
Author(s): Debra L. Thurston; Alexander H. Slocum
Show Abstract
Automated Dimensional Analysis Using A Light-Sectioning Microscope
Author(s): John Loomis; Allan Lightman; Allen Poe; Roger Caldwell
Show Abstract
Precision Measurement Of Corneal Topography
Author(s): P. R. Yoder Jr.; T. F. Macri; W. B. Telfair; P. S. Bennett; C. A. Martin; J. W Warner
Show Abstract
Laser Scanning Based Image Acquisition Systems
Author(s): Glenn Stutz
Show Abstract
Design Review Of A Complete Angle Scatter Instrument
Author(s): J. Rifkin; K. A. Klicker; D. R. Bjork; D. R. Cheever; T. F. Schiff; J. C. Stover; F. M. Cady; D. J. Wilson; P. D. Chausse; K. H. Kirchner
Show Abstract
Current Accuracy Limits Of Dynamic Imaging Microellipsometry
Author(s): Ralph F. Cohn; James W. Wagner
Show Abstract
Multisensor Boresighting
Author(s): Michael A. Pate
Show Abstract
Prototype Development Of A Microcontroller Based Field Optical Density Tester
Author(s): Daniel R. Cote; L. David LaFleur; Victor E. Cappelli; Robert H. Clayton; Kenneth J. Bingman
Show Abstract
Calibration Of Captive 9700 Illuminators
Author(s): Richard J. Wizenick
Show Abstract

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?