Share Email Print


Dimensional Optical Metrology and Inspection for Practical Applications VI
For the purchase of this volume in printed format, please visit

Volume Details

Volume Number: 10220
Date Published: 22 June 2017

Table of Contents
show all abstracts | hide all abstracts
Front Matter: Volume 10220
Author(s): Proceedings of SPIE
Polarized metrology systems (Conference Presentation)
Author(s): Rongguang Liang
Show Abstract
3D shape measurement using image-matching-based techniques
Author(s): Zhaoyang Wang; Hieu Nguyen
Show Abstract
High-speed 3D surface measurement with mechanical projector
Author(s): Jae-Sang Hyun; Song Zhang
Show Abstract
High-speed, high-accuracy large range 3D measurement
Author(s): Yatong An; Song Zhang
Show Abstract
Design and implementation of an electronic system to real-time capture and processing speckle interference patterns
Author(s): A. Barcelata-Pinzon; C. Meneses-Fabian; R. Juarez-Salazar; J. Moreno-Guzmán; M. Durán-Sánchez; R. I. Álvarez-Tamayo; C. Rangel-Romero; M. A. Navarro-Ahuatl
Show Abstract
Wavelength dependency of optical 3D measurements at translucent objects using fringe pattern projection
Author(s): Chen Zhang; Maik Rosenberger; Andreas Breitbarth; Gunther Notni
Show Abstract
Influence of the measurement object's reflective properties on the accuracy of array projection-based 3D sensors
Author(s): Stefan Heist; Peter Kühmstedt; Gunther Notni
Show Abstract
Absolute phase unwrapping for dual-camera system without embedding statistical features
Author(s): Chufan Jiang; Song Zhang
Show Abstract
Measuring optical phase digitally in coherent metrology systems
Author(s): Damien P. Kelly; James Ryle; Liang Zhao; John T. Sheridan
Show Abstract
Optimized measurement of gaps
Author(s): Kevin Harding; Rajesh Ramamurthy
Show Abstract
Temporal speckle correlations for optical alignment
Author(s): Florian Schurig; Damien P. Kelly
Show Abstract
On-machine metrology system (Conference Presentation)
Author(s): Hsiang Nan Cheng; Katherine Overend; Yu Zhang; Rongguang Liang
Show Abstract
Three-dimensional metrology for printed electronics
Author(s): Vadim Bromberg; Kevin Harding
Show Abstract
Measurement of material thickness in the presence of a protective film
Author(s): Rajesh Ramamurthy; Kevin Harding
Show Abstract
Physical security and cyber security issues and human error prevention for 3D printed objects: detecting the use of an incorrect printing material
Author(s): Jeremy Straub
Show Abstract
A combined system for 3D printing cybersecurity
Author(s): Jeremy Straub
Show Abstract
3D printing cybersecurity: detecting and preventing attacks that seek to weaken a printed object by changing fill level
Author(s): Jeremy Straub
Show Abstract
Fast 3D NIR systems for facial measurement and lip-reading
Author(s): Anika Brahm; Roland Ramm; Stefan Heist; Christian Rulff; Peter Kühmstedt; Gunther Notni
Show Abstract

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?