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Industrial Optoelectronic Measurement Systems Using Coherent Light
Editor(s): William F. Fagan

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 0863
Date Published: 1 June 1988

Table of Contents
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A Robot Based Automatic Paint Inspection System
Author(s): R. M. Atkinson; J. F. Claridge
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The Design Of Coherent Light Measurement Systems For Operation Under Harsh Conditions
Author(s): Robert Jones
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" High Bandwith Laser Heterodyne Interferometer To Measure Transient Mechanical Displacements "
Author(s): Jean-Loup Lesne; Alain Le Brun; Daniel Royer; Eugene Dieulesaint
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Laser Metrology Systems Used For Reactor Inspection In The CEGB
Author(s): B. A. Tozer; M. J. Little; R. S. Adrain
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Application Of Rotating Grating Systems In Laser Doppler Velocimetry
Author(s): B. Snijders; H. J. Raterink; Chr. de Snoo
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Velocity Field Visualization Using The Doppler-Picture Technique
Author(s): J. Srulijes; F. Seiler; A. George
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Flexible Mirrors For Imaging Radiated Energy From Rotating Components
Author(s): P. Waddell; T. Raptodimos; W. King; D. Warren
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Automatic Measurement Of A Crater Volume By Means Of A Light Sheet Projection
Author(s): H. Royer; J. Schwab
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Response Of Metallic Material To Micromachining
Author(s): H. J. Stadler; B. Freisleben; C. Heubeck
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Astigmatic Turbine Blade Tip Clearance Sensor For Gas Turbine Aero Engines
Author(s): I. Davinson
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White Light Holography Using Flexible Membrane Mirrors
Author(s): D. Warren; W. King; P. Waddell; T. Raptodimos
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Quantitative Evaluation Of Interference Patterns
Author(s): Thomas M. Kreis
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Welding Robot Guidance By Look-Ahead Optical Sensors
Author(s): L.H. J.F Beckmann; G. L. Oomen
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CCD Application For Interferometric Fringe Analysis Of Eroded Surface
Author(s): C. Pieralli; C. Tribilion; R. Devillers; Y. Cuerveno
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Surface Micro-Topography By Automatic Processing Of Projected Interference Fringes
Author(s): R. W. Wygant; S. P. Almeida; O. D.D. Soares
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Two Computer-Aided Methods For Data Reduction From Interferograms
Author(s): Wolfgang Osten; Roland Hofling; Jurgen Saedler
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A New Approach To 3-D Surface Texture Assessment On The Scanning Electron Microscope (Sem)
Author(s): A. F. Rashed; M. G. El-Sherbiny; H. M.N Falemban
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Measurement Of Transient Flow Field Phenomena With A Digital Heterodyne Interferometer
Author(s): D. M. Swain; M. T. Jacoby; J. D. Tomassian
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Recent Application Of Electronic Speckle Pattern Interferometry At The Norwegian Institute Of Technology
Author(s): Ole J. Lokberg; Jan T. Malmo
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25 Years Of Holography The Development Of Holographic Testing
Author(s): H. Rottenkolber
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Photographic Speckle Pattern Interferometry: An Analysis Of Its Fourier Components And Their Application To Electronic Speckle Pattern Interferometry (ESPI).
Author(s): F.Mendoza Santoyo; B. D. Bergquist
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Computer-Aided In-Plane-Displacement And-Strain Measurement By Means Of Holographic Interferometry
Author(s): W. Schwab; J. Gutjahr; A. Ettemeyer; H. Kockelmann
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Strain Analysis Using TV Speckle Interferometer
Author(s): H. El-Ghandoor; A. M. Hamed
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The Investigation Of Deformations Of Natural Stones Under Test-Conditions By Electronic Speckle Pattern Interferometry (ESPI)
Author(s): C. Holscher; G. Gulker; K. Hinsch; A. Kramer; H. Neunaber
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Optoelectronic Measurement Systems In The Industrial Field At The Aerospatiale Aquitaine Plant
Author(s): C. Le Floc'h
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Holography And Torsional Problems
Author(s): Gerhard Schonebeck
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Modular Holography For Use In Industry
Author(s): A. Ettemeyer; J. Schomer; H. Rottenkolber; E. Obermeier
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Curvature Radius Measurement Of Reflecting Surfaces By Moire Deflectometry
Author(s): J. F. Fernandez; O. D.D. Soares; M. Perez-Amor; J. Blanco
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Development And Application Of A Fibre Optic Electronic Speckle Pattern Interferometer (ESPI)
Author(s): Jeremy C. Davies; CIive H. Buckberry; Julian D.C. Jones; Chris N. Panell
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Pulsed Electronic Speckle Pattern Interferometry In Experimental Stress Analysis
Author(s): Richard W.T. Preater
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Computer Automated Holometry For Automotive Applications
Author(s): Gordon M. Brown
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