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Metrology of Optoelectronic Systems
Editor(s): Edward M. Granger

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 0776
Date Published: 6 November 1987

Table of Contents
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Alignment And Characterization Of Optical Systems And Components
Author(s): John Hannon
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A Holographic Interferometer To Test The Planoid Aspherics
Author(s): Farid Ruskanda
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Accounting For Polarization In Electrooptical Systems
Author(s): Russell A. Chipman; Qibo Zhou
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Stress-Birefringence In Semiconductor Wafers : Mapping Of Defect Structures
Author(s): Beverley T Meggitt
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Overview Of Current Scatterometer Measurements And The Impact On Optical Systems
Author(s): John C. Stover
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The Measurement Of Cavity Spacing For Fabry-Perot Interferometer With High Accuracy
Author(s): Wu Rul-Kun; Fang Zi-Wei
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The Development Of The Computer Controlled Electro-Fiber Optic System For Surface Roughness Measurement Of Metals
Author(s): B. S. Yilbas; K. Danisman; M. Yilmaz; Z. Yilbas
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Modified Spectrofluorimeter For Determination Of Absorptance In The Presence Of Fluorescence
Author(s): Roger T. McCleary; Roger J. Greenwald
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Lens Decenter Test Based On Laser Beam Interference
Author(s): Genrui Cao; R. E. Parks; Philip Lam
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Quality Merit Function In Specifications Of Hard Copy Devices
Author(s): Yigal Gur; Francis X. D. O'Donnell
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Specification And Acceptance Test Procedures For Hologon Laser Scanner Systems
Author(s): Charles J. Kramer
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Excess Signal Loss In Precision-Wound Optical Fiber
Author(s): Paul B. Buffin; C. C. Sung
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Measurement Of Contamination In Assembled Optical Systems
Author(s): Lionel R Baker
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Evaluation Of Crosstalk In Focal Plane Arrays Using Charge Carrier Diffusion Modeling
Author(s): P. E. Thurlow
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