Share Email Print


In Situ Industrial Applications of Optics
Editor(s): Jean P. L. Ebbeni

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 0672
Date Published: 22 July 1986

Table of Contents
show all abstracts | hide all abstracts
Real Time Image Enhancement By Simple Video Systems
Author(s): Frank Dubois; Jacques Carmeliet
Show Abstract
Automatic Identification And Data Collection Via Barcode Laser Scanning.
Author(s): Michel Jacobeus
Show Abstract
Optimisation Of The Cutting Up Of A Strip Of Float Glass
Author(s): G De Clerck; G Renard; J Smets; P Stappaerts; S A Glaverbel
Show Abstract
Optical Sensors For Factory Automation.
Author(s): Luc Lataire
Show Abstract
How To Get The Best From Your Artificial Vision System House ?
Author(s): A Michel; J P Fabry
Show Abstract
Use Of A Digital Theodolite With Infrared Radiation
Author(s): Gaston E. M Vandenhoeke
Show Abstract
Isis: Integrated Shape Imaging System (Oxford Metrics Ltd.) A New System For Follow-Up Of Scoliosis.
Author(s): M. Van Poucke M.D.; P Boone; M Vercauteren M.D.
Show Abstract
Optical Diffraction Extensometers
Author(s): J Ebbeni; H Sendrovicz
Show Abstract
Cross-Spectrum Technique For High-Sensitivity Remote Vibration Analysis By Optical Interferometry.
Author(s): M Corti; S Marazzini; A Martinelli; A De Agostini
Show Abstract
Compensation And Measurement Of Any Motion Of 3D-Objects In Holographic Interferometry
Author(s): A Stimpfling; P Smigielski
Show Abstract
Stereoscreen Three Dimensional Information
Author(s): M Bobot
Show Abstract
Holographic Double Pulse Yag Lasers
Author(s): Robert Stehle
Show Abstract
Miniature Optic Connectors
Author(s): Jean B Despouys; Dominique Marchal
Show Abstract
Stresses Field Analysis In An Adhesively Bonded Joint With Laser Photoelasticimetry.
Author(s): L Ben Aicha; Y Gilbert
Show Abstract
Locking Of The Light Pulse Delay In Externally Triggered Gas Lasers.
Author(s): L. Palffy
Show Abstract

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?