Share Email Print


Automatic Optical Inspection
Editor(s): Lionel R. Baker; H. John Caulfield

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 0654
Date Published: 17 November 1986

Table of Contents
show all abstracts | hide all abstracts
An Automated Electro-Optical Inspection System For Insitu Measurement Of Wear
Author(s): M Koukash; C A Hobson; M J Lalor; J T Atkinson
Show Abstract
Triangulation With Expanded Range Of Depth
Author(s): G Hausler; M Maul
Show Abstract
A Fast Time-Of-Flight Distance Sensor For Industrial Applications
Author(s): R Ahola; R Myllyla; A Kilpela
Show Abstract
A New Method For Measuring The Time-Of-Flight In Fast Laser Range Finding
Author(s): Raimo Ahola; Risto Myllyla
Show Abstract
Real-Time High Accuracy Measurements Utilizing Line-Scan Image Sensors
Author(s): D J Moreland; C A Hobson; M J Lalor; D B Clegg
Show Abstract
Television Measurement For Railway Structure Gauging
Author(s): Mark Edworthy
Show Abstract
Electro-Optical Inspection For Tolerance Control As An Integral Part Of A Flexible Machining Cell
Author(s): Blaise Renaud
Show Abstract
Observable Trends In Commercially Available Automated Optical Inspection Systems
Author(s): Don W Braggins
Show Abstract
Automatic Inspection In Car Industry : User Point-Of-View
Author(s): Robert Salesse
Show Abstract
Optical Characterization Of Microrough Surfaces : Limitations And Success Of The Theory
Author(s): D Maystre; J P Rossi; M Saillard
Show Abstract
Scratches: At What Price Quality
Author(s): John A Slater; Dennis A Cox
Show Abstract
Optical Sensors For Automated Surface Metrology
Author(s): Lionel R Baker
Show Abstract
Videooptical Quality Control Of Coated Surfaces
Author(s): W Kringler; P Schwarzmann
Show Abstract
Automated Electronic Speckle Pattern Interferometry - A Tool for Inspection
Author(s): K Paler
Show Abstract
The Present Status Of Electronic Speckle Pattern Interferometry (E.S.P.I.) With Respect To Automatic Inspection And Measurement
Author(s): B D Bergquist; P C Montgomery; F Mendoza-Santoyo; P Henry; J Tyrer
Show Abstract
Holographic Real Image Measurement Using A Computer Controlled,Closed Circuit Television System
Author(s): D G. Wright
Show Abstract
Measurement In Vision - The Need for Calibration
Author(s): John M Blackwell; Deepum N Bhatia
Show Abstract
Applications of Colour Processing In Optical Inspection
Author(s): W V Thomas; C. Connolly
Show Abstract
How Grey-Scale Processing Improves Vision System Performance
Author(s): James Vincent
Show Abstract
Automatic Optical Measurement Of Contact Lenses
Author(s): C J Elliott
Show Abstract
Automatic Non Contact Measurement System For The Inspection Of Shapes Cut In Sheet Material
Author(s): J F Bremner
Show Abstract
High Speed Alignment And Inspection In The Electronics Industry
Author(s): Gust Smeyers; Alfons Buts
Show Abstract
Automated Defect Inspection For In-Process Semiconductor Devices
Author(s): William H Arnold; Alan L Levine
Show Abstract
Automatic Inspection In Electronics Manufacturing
Author(s): Brent R Taylor
Show Abstract
A Novel Fibre Optic Illuminator for Machine Vision
Author(s): P Wagli; E Switzerland Morger
Show Abstract
Dimensional Measurement Of Moving Holes Using Spatial Filtering
Author(s): Yoshiro Suemoto
Show Abstract
Measurement Of Velocity With Cross-Correlation Technique For An Industrial Application
Author(s): F Francini; G Longobardi; R Bottos; F Grego
Show Abstract
Application of an Optical Correlator to Industrial Inspection
Author(s): S D Searle; A G Levenston; C Stace; H White; S Parker
Show Abstract
System For Automatic Detection And Recognition Of Defects In Textile Slivers
Author(s): M A Longree; J Muller; J Grignet
Show Abstract
In-Line Measurement Of Food Quality Using Light Emitting Diodes (LEDS) And Fibre Optics
Author(s): Ian McFarlane
Show Abstract
Vision Systems for Character Recognition in Industrial Applications
Author(s): H Engel; R Jung; L Schreiber
Show Abstract
A High Speed Automated Visual Inspection System
Author(s): A J McCollum; D E Kelly; B G Batchelor
Show Abstract
Automated Chromosome Analysis: A State-Of-The-Art Approach To Knowledge Based Image Analysis
Author(s): J Jaschul
Show Abstract
Automatic Off-Axis OTF Testing
Author(s): David M Berg
Show Abstract
Self-Adaptive Optical Color Discrimination
Author(s): P J. M. Vanhoutte; J J Engelen; G E Francois
Show Abstract
Automated Analysis Of Polymer Mixing Using An Industrial Vision System
Author(s): Rolf David Iverson; Frederick M. Waltz
Show Abstract
New Computer-Aided System For Automatic Fringe Analysis In Optical Metrologies
Author(s): B Breuckmann; W Thieme
Show Abstract
Holographic Non Destructive Testing With Automatic Evaluation
Author(s): Hans Steinbichler
Show Abstract
An Appraisal Of Artificial Intelligence Techniques For Industrial Vision Systems
Author(s): B G Batchelor
Show Abstract
An Expert System For Aircraft Design
Author(s): Jose Alsina; John P Fielding; Alan J Morris
Show Abstract
Model-Based Vision: Using Cues To Select Hypotheses
Author(s): G D Sullivan; K D Baker
Show Abstract

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?