Share Email Print


Automatic Inspection and Measurement
Editor(s): Richard A. Brook; Michael J. W. Chen

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 0557
Date Published: 19 December 1985

Table of Contents
show all abstracts | hide all abstracts
Development Of An Automated Image Shearing Microscope For Measuring The Critical Dimensions Of Magnetic Recording Heads.
Author(s): Chris P. Kirk; Richard W. Gale
Show Abstract
Design of Robot Hand-Based Intelligent Sensor for Measuring Six DOF Force/Torque Information
Author(s): Ren C. Luo; Michael J. Chen
Show Abstract
Stress Sensor
Author(s): J. R. Hodor; H. J. Decker Jr.; J. Barney; J. H. Green
Show Abstract
Hardware For High Speed Boundary Encoding From Large Line Scanned Images
Author(s): G A W West; T J Ellis; W J Hill
Show Abstract
A Practical Architecture For Machine Vision Based Measurement And Inspection
Author(s): E. Panofsky; D. McGhie
Show Abstract
Intelligent Visual Inspection Machines
Author(s): Robert Thibadeau; John Gabrick
Show Abstract
An Automatic Visual Alignment and Inspection Station for Tape Automated Bonding (TAB) Products
Author(s): Gerald J . Gleason; Tom Pandolfi; Russell R. Ames; Michael J Chen
Show Abstract
SAIL - A High Level Programming Language Translator for Visual Inspection of Industrial Assemblies
Author(s): Costae Tsatsoulis; King-sun Fu
Show Abstract
Multiprocessor Architectures for Automated Inspection Systems
Author(s): Barry Andrews
Show Abstract
A Digital Wafer Image and Geometry Processor
Author(s): George Huang; Dann Wang; Edward Huang; Chien Huang
Show Abstract
SMV - A Computer Vision Program for Loading Surface Mount Components
Author(s): Ning San Chang
Show Abstract
Optimal Utilization Of A State-Of-The-Art Machine Vision Architecture
Author(s): Abe Israel Coriat
Show Abstract
High-Speed Processing For Automatic Visual Inspection And Measurement.
Author(s): P. Suetens; A. Oosterlinck; M. J. Chen
Show Abstract
Turnkey Optical Inspection Systems: Getting What You Want
Author(s): Burton D. Figler
Show Abstract
Description Of A New High Accuracy Method Of Angle Measurement By Multireflected Autocollimation
Author(s): Mark Shechterman
Show Abstract
Measures of Circularit for Automatic Inspection Applications
Author(s): J Illingworth; J Kittler
Show Abstract
A Microprogrammable Processor For Image Operations
Author(s): J. Rommelaere; L. Van Eycken; P. Wambacq; A. Oosterlinck
Show Abstract
Investigation On The Second Optical Inspection Of ICs
Author(s): G. Schreurs; E. Bellon; M. Vercruyssen; A . Oosterlinck
Show Abstract
Real-Time Automatic Inspection Of Web Materials
Author(s): Stephen McKaughan
Show Abstract
Automated Inspection Of Magnetic Media By Laser Scanning
Author(s): Pedro Lilienfeld; Sergey Broude; Eric Chase; George Quackenbos
Show Abstract
Remote Visual Inspection Of Nuclear Fuel Pellets With Fiber Optics And Video Image Processing
Author(s): Frank W. Moore
Show Abstract
On-line Visual Inspection Of Automobile Display Panels
Author(s): R M Atkinson; J F Claridge; S R Hattersley; J C Taunton
Show Abstract
On the Forecasting of Lathe Cutting Dynamics(1)
Author(s): Nejat Olgac; Guoquan Zhao
Show Abstract

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?