
Proceedings Paper
A method for phase unwrapping base digital spackle correlationFormat | Member Price | Non-Member Price |
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Paper Abstract
A new method for phase unwrapping is proposed, which makes the unwrapping of phase images realistic without binary
codes or more frequency fringe images produced by projection systems, uses only one additional digital speckle pattern
projected to help finding correspondence points. It means that the novel method is by the use of the additional speckle
pattern to achieve a unique point correspondence. The proposed method to get unwrapped phase will save images
recorded time. Experiment results demonstrated the proposed method is effective and robust.
Paper Details
Date Published: 20 November 2012
PDF: 6 pages
Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 856317 (20 November 2012); doi: 10.1117/12.999965
Published in SPIE Proceedings Vol. 8563:
Optical Metrology and Inspection for Industrial Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)
PDF: 6 pages
Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 856317 (20 November 2012); doi: 10.1117/12.999965
Show Author Affiliations
Published in SPIE Proceedings Vol. 8563:
Optical Metrology and Inspection for Industrial Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)
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