
Proceedings Paper
Holographic approach to detection of delamination areas in layered polymeric waveguides by means of strain solitonsFormat | Member Price | Non-Member Price |
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Paper Abstract
Laminated structures are increasingly used nowadays in a wide variety of constructions. The proper functioning of such
structures has vital importance especially in automotive and aerospace industries. The major problem in their behavior is
a possibility of a sudden and irreversible delamination caused by various factors. We propose and study a NDT approach
to investigate the dynamics of prolonged layered structures based on the propagation and optical (holographic) detection
of bulk strain solitons in them. Results on experimental observation of the evolution of bulk solitary waves in polymeric
2- and 3-layered waveguides with glassy and rubber-like adhesives used for bonding are discussed. Variations of soliton
amplitude were shown to demonstrate the existence of delamination areas. The formation of complex wave patterns –
soliton trains or radiating solitons became an additional evidence of defects in layered waveguides.
Paper Details
Date Published: 20 November 2012
PDF: 11 pages
Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 85630V (20 November 2012); doi: 10.1117/12.999709
Published in SPIE Proceedings Vol. 8563:
Optical Metrology and Inspection for Industrial Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)
PDF: 11 pages
Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 85630V (20 November 2012); doi: 10.1117/12.999709
Show Author Affiliations
Irina V. Semenova, Ioffe Physical-Technical Institute (Russian Federation)
Galina V. Dreiden, Ioffe Physical-Technical Institute (Russian Federation)
Galina V. Dreiden, Ioffe Physical-Technical Institute (Russian Federation)
Karima R. Khusnutdinova, Loughborough Univ. (United Kingdom)
Alexander M. Samsonov, Ioffe Physical-Technical Institute (Russian Federation)
Alexander M. Samsonov, Ioffe Physical-Technical Institute (Russian Federation)
Published in SPIE Proceedings Vol. 8563:
Optical Metrology and Inspection for Industrial Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)
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